Access to European nanoelectronics network
01 May 2015 – 30 April 2019
ASCENT will ensure access to the most advanced CMOS technologies in Europe’s leading nanofabrication research centers. The access is open to all researchers in universities, research centers, SMEs and industry, and creates the opportunity to share technological and scientific practices, train new researchers and establish a research network. Additionally, ASCENT will provide an interface to global industrial leaders in nanoelectronics. By providing access to knowledge in world-leading technologies, the project will contribute significantly to growth and competitiveness of the European nanoelectronics industry.
Atom Probe Tomography (APT) metrology for future 3D semiconductor devices
H2020, Marie Skłodowska-Curie
01 August 2015 – 31 July 2017
APT-Met presents a training-by-research plan for Atom Probe Tomography (APT) in the semi-conductor field. In this domain, APT still suffers from many challenges, both from a fundamental understanding perspective and regarding operational excellence. However, research on the exploitation of APT for next-generation semi-conductor devices requires access to expensive tools and advanced semi-conductor technology, resulting in a limited number of trained researchers. The project therefore aims to advance APT and provide substantial training and knowledge of the technique. The training activities aim to broaden the technical skills of the researchers in a novel research field and thereby open possibilities for further participation in future collaborative projects.
EU project webpage: http://www.cordis.europa.eu/project/rcn/195974_en.html