/Advancing Micro-Display Metrology: A Comprehensive Study on Fabrication, Defect Analysis, and Fourier Ptychographic Microscopy Inspection

Advancing Micro-Display Metrology: A Comprehensive Study on Fabrication, Defect Analysis, and Fourier Ptychographic Microscopy Inspection

Master projects/internships - Brussel | More than two weeks ago

Explore the latest developments in micro-display technology, including defect inspection techniques, and gain hands-on experience with micro-display structures. 

The escalating demand for micro-display technologies, such as virtual reality (VR) and near-eye augmented reality (AR) devices, has accentuated the paramount importance of precise defect detection. As we transition towards high-volume manufacturing (HVM) for market entry, multiple strategies have been proposed. Nonetheless, it is crucial to implement not only defect-free methodologies but also continuous defect monitoring. Our research is centered on evaluating current fabrication methodologies, conducting comprehensive analyses of potential defect metrology, and enhancing inspection procedures. The primary objective of our project is to concentrate on micro LED applications and methodically evaluate a novel inspection system based on Fourier ptychographic microscopy (FPM). This system will enable the reconstruction of a sample's 3D profile with rapid, high-resolution imaging across a broad field of view, encompassing the entire dimensions of a micro LED device.

Type of Project: Combination of internship and thesis; Internship; Thesis 

Master's degree: Master of Engineering Science; Master of Science 

For more information or application, please contact Hyun-su Kim (hyun-su.kim@imec.be)

 

Imec allowance will be provided. 

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