CMOS and beyond CMOS
Discover why imec is the premier R&D center for advanced logic & memory devices. anced logic & memory devices.
Connected health solutions
Explore the technologies that will power tomorrow’s wearable, implantable, ingestible and non-contact devices.
Life sciences
See how imec brings the power of chip technology to the world of healthcare.
Sensor solutions for IoT
Dive into innovative solutions for sensor networks, high speed networks and sensor technologies.
Artificial intelligence
Explore the possibilities and technologies of AI.
More expertises
Discover all our expertises.
Be the first to reap the benefits of imec’s research by joining one of our programs or starting an exclusive bilateral collaboration.
Build on our expertise for the design, prototyping and low-volume manufacturing of your innovative nanotech components and products.
Use one of imec’s mature technologies for groundbreaking applications across a multitude of industries such as healthcare, agriculture and Industry 4.0.
Venturing and startups
Kick-start your business. Launch or expand your tech company by drawing on the funds and knowhow of imec’s ecosystem of tailored venturing support.
/Job opportunities/Characterization and statistical analysis of waveguide losses on a silicon nitride photonics platform

Characterization and statistical analysis of waveguide losses on a silicon nitride photonics platform

Master projects/internships - Leuven | More than two weeks ago

Silicon nitride photonic waveguides operating at visible wavelengths provide a great platform for sensing applications. In most waveguide-based sensing demonstrators, the analyte solution or gas is brought into close proximity of the waveguide, such that it overlaps with the waveguide’s evanescent field. This allows detection schemes based on absorption, fluorescence and even Raman scattering. Several molecular recognition systems have been demonstrated in literature, for example glucose sensors and enzymatic assays on waveguides. For real life applications, we need to increase the sensitivity, reduce the limit of detection and improve the reproducibility of waveguide-based sensing systems. To bring this technology to the next level, we need a detailed understanding of the origin of the different sources of waveguide variability. This will be achieved by performing a systematic characterization of waveguides with different geometries and cladding materials and a consecutive statistical analysis of the obtained data.

The master student will characterize different photonic test structures tailored towards various possible sources of variability. The student will master handing photonics wafers and learn to operate an automated photonics wafer probe station. He/she is responsible for the full experimental characterization and interpretation of the relevant waveguide structures and will perform a thorough statistical analysis to find the causes of waveguide variability on a single die, from die-to-die and from wafer-to-wafer.

Type of Project: Thesis

Duration: 1 year

Master's degree: Master of Science; Master of Engineering Science

Master program: Physics; Nanoscience & Nanotechnology

Supervising scientists: For further information or for application, please contact Pieter Neutens (, Wim Van Roy ( en Pol Van Dorpe

Only for self-supporting students