/Characterization and statistical analysis of waveguide losses on a silicon nitride photonics platform

Characterization and statistical analysis of waveguide losses on a silicon nitride photonics platform

Master projects/internships - Leuven | More than two weeks ago

Silicon nitride photonic waveguides operating at visible wavelengths provide a great platform for sensing applications. In most waveguide-based sensing demonstrators, the analyte solution or gas is brought into close proximity of the waveguide, such that it overlaps with the waveguide’s evanescent field. This allows detection schemes based on absorption, fluorescence and even Raman scattering. Several molecular recognition systems have been demonstrated in literature, for example glucose sensors and enzymatic assays on waveguides. For real life applications, we need to increase the sensitivity, reduce the limit of detection and improve the reproducibility of waveguide-based sensing systems. To bring this technology to the next level, we need a detailed understanding of the origin of the different sources of waveguide variability. This will be achieved by performing a systematic characterization of waveguides with different geometries and cladding materials and a consecutive statistical analysis of the obtained data.

The master student will characterize different photonic test structures tailored towards various possible sources of variability. The student will master handing photonics wafers and learn to operate an automated photonics wafer probe station. He/she is responsible for the full experimental characterization and interpretation of the relevant waveguide structures and will perform a thorough statistical analysis to find the causes of waveguide variability on a single die, from die-to-die and from wafer-to-wafer.

Type of Project: Thesis

Duration: 1 year

Master's degree: Master of Science; Master of Engineering Science

Master program: Physics; Nanoscience & Nanotechnology

Supervising scientists: For further information or for application, please contact Pieter Neutens (pieter.neutens@imec.be), Wim Van Roy (wim.vanroy@imec.be) en Pol Van Dorpe pol.vandorpe@imec.be).

Only for self-supporting students