Leuven | More than two weeks ago
Free-standing thin membranes or pellicles, thickness < 100 nm, are becoming increasingly attractive due to their wide range of applications in extreme ultraviolet (EUV) lithography, microelectromechanical systems, far-infrared sensors, etc. The silicon nitride (SiNx) and carbon nanotubes pellicles are two widely deployed examples. Apparently, the performance of such thin foils highly relies on the composition and thickness of the pellicle.
We have adopted two ion beam analysis (IBA) techniques for elemental quantification in thin pellicles. These techniques are Rutherford Backscattering spectrometry (RBS) and Nuclear Reaction Analysis (NRA) in the transmission geometry. To further improve and assess the sensitivity of these characterization techniques, pellicles with different compositions (B, SiNx, etc) and thicknesses are required to be developed in the cleanroom. The student will be also trained on the characterization of the fabricated pellicles using RBS technique.
Objectives of the internship:
Type of project: Internship, Combination of internship and thesis
Duration: 6 -12 months
Required degree: Master of Science, Master of Engineering Science
Required background: Materials Engineering, Nanoscience & Nanotechnology, Physics, Chemistry/Chemical Engineering
Supervising scientist(s): For further information or for application, please contact: Masoud Dialameh (Masoud.Dialameh@imec.be)