/Study on the influence of grow conditions in the physical properties of MX2 materials. Case of Study: In-plane X-ray Difraction (Master)

Study on the influence of grow conditions in the physical properties of MX2 materials. Case of Study: In-plane X-ray Difraction (Master)

Leuven | More than two weeks ago

Extending the class of materials in CMOS fabrication

Novel two-dimensional materials, and especially semi-conducting transition metal dichalcogenides (MX2, with M a transition metal and X a chalcogen) offer advanced functionality in complex and ultra-scaled integrated systems. In view of their compelling electronic, magnetic and optical properties for a monolayer form, imec explores their integration for various applications and systems, in particular for advanced CMOS technologies in a beyond silicon roadmap. 

Improving channel transport properties, scaling the equivalent gate oxide thickness and reducing the contact resistance are the main challenges for demonstrating performant 2D scaled devices. As some progresses have been made recently in channel and gate stack performance, material development remains a focus point for achieving high device performance.

 

MX2 material development rely on good characterization of the physical properties. In this context IMEC is working on several techniques to correlate the growth conditions to the physical properties of the MX2 material.

 

In this context in-plane XRD has the potential to be used to extract crystal orientation of as grown films. However, in-plane XRD on 2D materials is relatively unexplored.

 

In this project, the candidate will be part of the MX2 growth team imec and will work in close relationship with different characterization teams trying to correlate in-pane XRD measurements with other physical characterization techniques. We want to understand how to improve the growth of our materials based on the physical characterization of the films. This is an experimental topic and requires working most of the time in the clean room. Activities include manipulation and preparation of samples for growth. The realisation of physical characterisations: In-plane XRD, optical microscopy, AFM and Raman/PL spectroscopy together with the analysis of the data. All the necessary training will be provided, and we will support you in the writing of your Master thesis.



Type of project: Thesis, Combination of internship and thesis

Required degree: Master of Engineering Technology, Master of Science, Master of Engineering Science

Required background: Chemistry/Chemical Engineering, Materials Engineering, Nanoscience & Nanotechnology, Physics

Supervising scientist(s): For further information or for application, please contact: Henry Medina Silva (Henry.MedinaSilva@imec.be)

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