It is our great pleasure to invite you to the Workshop on Defects 2020 that will be held on April 16-17, 2020 in IMEC, Leuven, Belgium.
After the successful Doctoral Summer School on Defects in Semiconductor Devices and Materials, organized at Ghent University, in September 10-14, 2018 at the University of Gent, this is a follow-up Workshop on Defects, where besides invited papers by eminent speakers in the field, abstracts are solicited covering the experimental and theoretical studies of defects in semiconductor materials; their impact on device operation, reliability and yield; their formation and control during crystal and epitaxial growth. Especially the contribution of (PhD) students are encouraged, with both poster and oral contributions, where a best paper award will be granted to the most outstanding work.
The overall goal is to bring together Authorities in the field with young researchers from both academia and industry in order to discuss defect-related issues in semiconductor manufacture and processing. Defect control and gettering have paved the way to successful IC manufacturing and have been based on a wealth of insight gathered since the early days. However, further pushing the limits of device scaling and operation requires even higher levels of defect engineering than available today, even up to single defect/impurity control. Therefore, this Workshop should contribute to developing a deeper understanding of fundamental defect mechanisms and practical defect control, especially in view of the electrical device and circuit performance.