CMOS scaling

Atomic layer deposition of ruthenium for advanced interconnect applications
Adelmann, C.; Popovici, M.; Groven, B.; Wen, L.; Dutta, S.; Boemmels, J.; Tokei, Z. and Van Elshocht, S.
Materials for Advanced Metalization Conference - MAM p. PMT-08

Comparison of short-channel effects in monolayer MoS2 based junctionless and inversion-mode field-effect transistors
Agarwal Kumar, T.; Soree, B.; Radu, I.; Raghavan, P.; Fiori, G.; Iannaccone, G.; Thean, A.; Heyns, M. and Dehaene, W.
Applied Physics Letters 108 (2), p. 23506

Wavelength locking of a Si photonic ring transmitter using a dithering-based OMA stabilizing feedback loop
Agarwal, S.; Ingels, M.; Rakowski, M.; Pantouvaki, M.; Steyaert, M.; Absil, P. and Van Campenhout, J.
Optical Fiber Communications Conference And Exhibition - OFC, p. Th1F.5

Intrinsic voltage gain of Line-TFETs and comparison with other TFET and MOSFET architectures
Agopian, P.; Rooyackers, R.; Martino, J.; Vandooren, A.; Simoen, E.; Claeys, C. and Thean, A.
ieeexplore.ieee.org/stamp/stamp.jspJoint International EUROSOI-Workshop and International Conference on Ultimate Integration on Silicon - ULIS

Understanding and optimizing the floating body retention in FDSOI UTBOX
Aoulaiche, M.; Simoen, E.; Caillat, C.; Witters, L.; Bourdelle, K.; Nguyen, B.; Martino, J.; Claeys, C.; Fazan, P. and Jurczak, M.
Solid-State Electronics 117, p. 123 - 129

1/f noise measurements for faster electromigration characterization
Beyne, S.; Croes, K.; De Wolf, I. and Tokei, Z.
IEEE International Reliability Physics Symposium - IRPS, p. 5B.3

Junctionless array with ultrathin poly\TiN floating gate and HfAlO based intergate dielectric for sub-15nm planar NAND Flash
Blomme, P.; Versluijs, J.; Ercken, M.; Souriau, L.; Hody, H.; Vecchio, E.; Paraschiv, V.; Tan, C.; Van den Bosch, G. and Van Houdt, J.
International Memory Workshop - IMW, p. 113 - 116

Low-frequency noise assessment in n- and p-channel sub-10nm triple-gate FinFETs
Boudier, D.; Cretu, B.; Simoen, E.; Veloso, A.; Collaert, N. and Thean, A.
Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon - ULIS

Passivation of poly-Si channel vertical NAND devices du high pressure annealing
Breuil, L.; lisoni, J.; Delhougne, R.; Tan, C.; Van Houdt, J.; Van den Bosch, G. and Furnemont, A.
International Memory Workshop - IMW, p. 88 - 91

Direct three-dimensional observation of the conduction in poly-Si and In1-xGaxAs 3D NAND vertical channels
Celano, U.; Capogreco, E.; Lisoni, J.; Arreghini, A.; Kunert, B.; Guo, W.; Van den Bosch, G.; Van Houdt, J.; De Meyer, K.; Furnemont, A. and Vandervorst, W.
Symposium on VLSI Technology, p. 192 - 193

Tuning the switching behavior of conductive-bridge memory by the modulation of Cu content in the cation-supplier alloys
Celano, U.; Mirabelli, L.; Goux, L.; Opsomer, K.; Devulder, W.; Crupi, F.; Detavernier, C.; Jurczak, M. and Vandervorst,W.
Materials for Advanced Metallization - MAM

An RTN-based defect tracking technique: experimentally probing the spatial and energy profile of the critical filament region and its correlation with HfO2 RRAM switching operation and failure mechanism
Chai, Z.; Ma, J.; Zhang, W.; Govoreanu, B.; Simoen, E.; Zhang, J.; Li, Z.; Gao, R.; Groeseneken, G. and Jurczak, M.
Symposium on VLSI Technology, p. 122 - 123

-1 V bias 56 Gbps germanium waveguide p-i-n photodetector with silicon contacts
Chen, H.; Verheyen, P.; De Heyn, P.; Lepage, G.; De Coster, J.; Absil, P.; Roelkens, G. and Van Campenhout, J.
Optical Fiber Communication Conference - OFC, p. Tu2D.6

Novel flexible and cost-effective retention assessment method for TMO-based RRAM
Chen, M.; Fantini, A.; Goux, L.; Gorine, G.; Redolfi, A.; Groeseneken, G. and Jurczak, M.
IEEE Electron Device Letters 37 (9), p. 1112 - 1115

Low-current operation of novel Gd2O3-based RRAM cells with large memory window
Chen, M.; Goux, L.; Fantini, A.; Redolfi, A.; Groeseneken, G. and Jurczak, M.
Physica Status Solidi A 213 (2), p. 320 - 324

Oxygen chemical potential optimization for low current (<10µA) resistive switching in oxide-based RRAM
Chen, M.; Goux, L.; Fantini, A.; Redolfi, A.; Groeseneken, G. and Jurczak, M.
International Symposium on VLSI Technology, Systems and Application - VLSI-TSA, p. T2-2

Doped Gd-O based RRAM for embedded application
Chen, M.; Goux, L.; Fantini, A.; Redolfi, A.; Groeseneken, G. and Jurczak, M.
International Memory Workshop - IMW, p. 60 - 63

Directed self-assembly of PS-b-PMMA with ionic liquid addition
Chen, X.; Seo, T.; Rincon Delgadillo, P.; Matsumiya, T.; Kawaue, A.; Maehashi, T.; Gronheid, R. and Nealey, P.
Advances in Patterning Materials and Processes XXXIII, p. 97790S

Controlled sulfurization process for the synthesis of large area MoS2 films and MoS2-WS2 heterostructures
Chiappe, D.; Asselberghs, I.; Sutar, S.; Iacovo, S.; Afanasiev, V.; Stesmans, A.; Balaji, Y.; Peters, L.; Heyne, M.; Mannarino, M.; Vandervorst, W.; Sayan, S.; Huyghebaert, C.; Caymax, M.; Heyns, M.; De Gendt, S.; Radu, I. and Thean,A.
Advanced Materials Interfaces 3 (4), p. DOI: 10.1002/ad

Impact of wire geometry on interconnect RC and circuit delay
Ciofi, I.; Contino, A.; Roussel, P.; Baert, R.; Vega Gonzalez, V.; Croes, K.; Badaroglu, M.; Wilson, C.; Raghavan, P.; Mercha, A.; Verkest, D.; Groeseneken, G.; Mocuta, D. and Thean, A.
IEEE Transactions on Electron Devices 63 (6), p. 2488 - 2496

All electrical propagating spin wave spectroscopy with broadband wavevector capability
Ciubotaru, F.; Devolder, T.; Manfrini, M.; Adelmann, C. and Radu,I.
Applied Physics Letters 109 (1), p. 12403

Device assessment of electrically active defects in high-mobility materials
Claeys, C.; Simoen, E.; Eneman, G.; Ni, K.; Hikavyy, A.; Loo, R.; Gupta, S.; Merckling, C.; Alian, A. and Caymax, M.
ECS Journal of Solid State Science and Technology 5 (4), p. P3149 - 3165

Mastering the art of high mobility material integration on Si: a path towards power-efficient CMOS and functional scaling
Collaert, N.
Journal of Low Power Electronics and Applications, p. 1 - 11

Beyond-Si materials and devices for more Moore and more than Moore applications
Collaert, N.; Alian, A.; Arimura, H.; Boccardi, G.; Eneman, G.; Franco, J.; Ivanov, T.; Lin, D.; Mitard, J.; Ramesh, S.; Rooyackers, R.; Schaekers, M.; Sibaja-Hernandez, A.; Sioncke, S.; Smets, Q.; Vais, A.; Vandooren, A.; Veloso, A.; Verhulst, A.; Verreck, D.; Waldron, N.; Walke, A.; Witters, L.; Yu, H.; Zhou, D. and Thean, A.
International Conference on IC Design and Technology - ICICDT, p.1

Challenges in LER/CDU metrology in DSA: placement error and cross-line correlations
Constantoudis, V.; Kuppuswamy, V.; Gogolides, E.; Vaglio Pret, A.; Pathangi Sriraman, H. and Gronheid, R.
Metrology, Inspection, and Process Control for Microlithography XXX, p. 97781X

Oxygen scavenging by Ta spacers in double-MgO free layers for perpendicular spin-transfer torque magnetic random-access memory
Couet, S.; Swerts, J.; Mertens, S.; Lin, T.; Tomczak, Y.; Liu, E.; Douhard, B.; Van Elshocht, S.; Furnemont, A. and Kar, G.
30IEEE Magentics Letters 7, p. 31004 

B-spline X-ray diffraction imaging — rapid non-destructive measurement of die warpage in ball grid array packages
Cowley, A.; Ivankovic, A.; Wong, C.; Bennett, N.; Danilewsky, A.; Gonzalez, M.; Cherman, V.; Vandevelde, B.; De Wolf, I. and McNally, P.
Microelectronics Reliability 59, p. 108 - 116

Reliability challenges related to TSV integration and 3D stacking Croes, K.; De Messemaeker, J.; Li, Y.; Guo, W.; Varela Pedreira, O.; Cherman, V.; Stucchi, M.; De Wolf, I. and Beyne, E.
IEEE Design & Test of Computers 33 (3), p. 37 - 45

Sacrificial self-assembled monolayers for the passivation of GaAs (100) surfaces and interfaces
Cuypers, D.; Fleischmann, C.; van Dorp, D.; Brizzi, S.; Tallarida, M.; Müller, M.; Hönicke, P.; Billen, A.; Chintala, R.; Conard, T.; Schmeisser, D.; Vandervorst, W.; Van Elshocht, S.; Armini, S.; De Gendt, S. and Adelmann, C.
Chemistry of Materials 28 (16), p. 5689 - 5701

Test-station for flexible semi-automatic wafer-level silicon photonics testing
De Coster, J.; De Heyn, P.; Pantouvaki, M.; Snyder, B.; Chen, H.; Marinissen, E.; Absil, P.; Van Campenhout, J. and Bolt,B.
21th IEEE European Test Symposium - ETS, p. 1 - 6

Paths towards low-damage etching of highly porous organo-silicate low-k dielectrics
de Marneffe, J.; Zhang, L.; Watanabe, M.; Yatsuda, K.; Maekawa, K.; Cooke, M.; Goodyear, A.; Leroy, F.; Tillocher, T.; Lefaucheux, P.; Dussart, R.; Dussarat, C. and Baklanov, M.
SPIE Advanced Lithography

Quantitative model for post-program instabilities in filamentary RRAM
Degraeve, R.; Fantini, A.; Gorine, G.; Roussel, P.; Clima, S.; Chen, M.; Govoreanu, B.; Goux, L.; Linten, D.; Jurczak, M. and Thean, A.
IEEE Reliability Physics Symposium - IRPS, p. 6C.1

Evolution of perpendicular magnetized tunnel junctions upon annealing
Devolder, T.; Couet, S.; Swerts, J. and Furnemont, A.
Applied Physics Letters 108 (17), p. 172409

Time-resolved spin-torque switching in MgO-based perpendicularly magnetized tunnel junctions
Devolder, T.; Kim, J.; Garcia-Sanchez, F.; Swerts, J.; Kim, W.; Couet, S.; Kar, G. and Furnemont, A.
Physical Review B 93 (2), p. 24420

Study of amorphous Cu-Te-Si thin films showing high thermal stability for application as a cation supply layer in conductive bridge random access memory devices
Devulder, W.; Opsomer, K.; Minjauw, M.; Meersschaut, J.; Jurczak, M.; Goux, L. and Detavernier, C.
RSC Advances 6 (38), p. 32106 - 32114

On the manifestation of phosphorus-vacancy complexes in epitaxial Si:P films
Dhayalan, S.; Kujala, J.; Slotte, J.; Pourtois, G.; Simoen, E.; Rosseel, E.; Hikavyy, A.; Shimura, Y.; Iacovo, S.; Stesmans, A.; Loo, R. 
Applied Physics Letters 108 (8), p. 82106

Influence of template fill in grapho-epitaxy DSA
Doise, J.; Bekaert, J.; Chan, B.; Hong, S.; Lin, G. and Gronheid,R.
Advances in Patterning Materials and Processes XXXIII, p. 97791G

Influence of elemental incorporation of Ti, Si and N on thermal stability of GeTe6 ovonic threshold switching material for selector applications
Dumortier, J.; Opsomer, K.; Velea, A.; Govoreanu, B.; Jurczak, G.; Van Elshocht, S. and Detavernier, C.
Materials for Advanced Metallization (MAM) 2016, p. 123 - 124

Thickness dependence and annealing behavior of Pt-group metal thin films as alternative metals for advanced interconnects
Dutta, S.; Opsomer, K.; Hoque, A.; Peeters, K.; Richard, O.; Detavernier, C.; Van Elshocht, S.; Boemmels, J.; Tokei, Z.; Vandervorst, W. and Adelmann, C.
Materials for Advanced Metallization Conference - MAM 2016, p. 149 - 150

Influence of doping and tunneling interface stoichiometry on n+In0.5Ga0.5As/p+GaAs0.5Sb0.5 Esaki diode behavior
El Kazzi, S.; Alian, A.; Bordallo, C.; Smets, Q.; Desplanque, L.; Wallart, X.; Richard, O.; Douhard, B.; Verhulst, A.; Collaert, N.; Merckling, C.; Heyns, M. and Thean, A.
International Symposium on Functional Diversification of Semiconductor Electronics 3 (More-Than-Moore 3), p. 73 - 80

Impact of the effective work function gate metal on the low-frequency noise of gate-all-around Silicon-on-Insulator NWFETs
Fang, W.; Veloso, A.; Simoen, E.; Cho, M.; Collaert, N.; Thean, A.; Luo, J.; Zhao, C.; Ye, T. and Claeys, C.
IEEE Electron Device Letters 37 (4), p. 363 - 365

Intrinsic robustness of TFET subthreshold swing to interface and oxide traps: a comparative PBTI study of InGaAs TFETs and MOSFETs
Franco, J.; Alian, A.; Vandooren, A.; Verhulst, A.; Linten, D.; Collaert, N. and Thean, A.
IEEE Electron Device Letters 37 (8), p. 1055 - 1058

NBTI in replacement metal gate SiGe core finFETs: impact of Ge concentration, fin width, fin rotation and interface passivation by high pressure anneal
Franco, J.; Kaczer, B.; Vaisman Chasin, A.; Mertens, H.; Ragnarsson, L.; Ritzenthaler, R.; Mukhopadhyay, S.; Arimura, H.; Roussel, P.; Bury, E.; Horiguchi, N.; Linten, D.; Groeseneken, G. and Thean, A.
IEEE International Reliability Physics Symposium - IRPS, p. 4B.2

Demonstration of an InGaAs gate stack with sufficient PBTI reliability by thermal budget optimization, nitridation, high-k material choice, and interface dipole
Franco, J.; Vais, A.; Sioncke, S.; Putcha, V.; Kaczer, B.; Shie, B.; Shi, X.; Reyhaneh, M.; Nyns, L.; Zhou, D.; Waldron, N.; Maes, J.; Xie, Q.; Givens, M.; Tang, F.; Jiang, X.; Arimura, H.; Schram, T.; Ragnarsson, L.; Sibaja-Hernandez, A.; Hellings, G.; Horiguchi, N.; Heyns, M.; Groeseneken, G.; Linten, D.; Collaert, N. and Thean, A.
Symposium on VLSI Technology, p. 42 - 43

Carrier lifetime spectrocopy for defect characterization in semiconductor materials and devices
Gaubas, E.; Simoen, E. and Vanhellemont, J.
ECS Journal of Solid State Science and Technology 5 (4), p. P3108 - P3137

Co-optimization of RegC and TWINSCANTM corrections to improve the intra-field on-product overlay performance
Gorhad, K.; Sharon, O.; Dmitriev, V.; Cohen, A.; van Haren, R.; Roelofs, C.; Cekli, H.; Gallagher, E.; Leray, P.; Beyer, D.; Trautsch, T. and Steinert, S.
Metrology, Inspection, and Process Control for Microlithography XXX, p. 97783D

Advanced a-VMCO resistive switching memory through inner interface engineering with wide (>102) on/off window, tunable µA-range switching current and excellent variability
Govoreanu, B.; Di Piazza, L.; Ma, J.; Conard, T.; Vanleenhove, A.; Belmonte, A.; Radisic, D.; Popovici, M.; Velea, A.; Redolfi, A.; Richard, O.; Clima, S.; Adelmann, C.; Bender, H. and Jurczak, M.
Symposium on VLSI Technology, p. 82 - 83

EUV patterned templates with grapho-epitaxy DSA at the N5/N7 logic nodes
Gronheid, R.; Boeckx, C.; Doise, J.; Bekaert, J.; Karageorgos, I.; Ryckaert, J.; Chan, B.; Li, C. and Zou, Y. 
Extreme Ultraviolet (EUV) Lithography VII, p. 97761W

Density and capture cross-section of interface traps in GeSnO2 and GeO2 grown on hetero-epitaxial GeSn
Gupta, S.; Simoen, E.; Loo, R.; Madia, O.; Lin, D.; Merckling, C.; Shimura, Y.; Conard, T.; Lauwaert, J.; Vrielinck, H. and Heyns, M.
ACS Applied Materials & Interfaces 8 (21), p. 13181 - 13186

Design-based metrology: beyond CD/EPE metrics to evaluate printability performance
Halder, S.; Mailfert, J.; Leray, P.; Rio, D.; Peng, H. and Laenens, B.
Metrology, Inspection, and Process Control for Microlithography XXX, p. 97780W

Multilayer MoS2 growth by metal and metal oxide sulfurization
Heyne, M.; Chiappe, D.; Meersschaut, J.; Nuytten, T.; Conard, T.; Richard, O.; Bender, H.; Moussa, A.; Huyghebaert, C.; Radu, I.; Caymax, M.; de Marneffe, J.; Neyts, E. and De Gendt, S.
Journal of Materials Chemistry C (4), p. 1295 - 1304

Properties and growth peculiarities of Si0.30Ge0.70 stressor integrated in 14 nm fin-based p-type metal-oxide-semiconductor field-effect transistors
Hikavyy, A.; Rosseel, E.; Kubicek, S.; Mannaert, G.; Favia, P.; Bender, H.; Loo, R. and Horiguchi, N.
Thin Solid Films 602, p. 72 - 77

Patterning challenges in advanced device architectures: FinFETs to nanowire
Horiguchi, N.; Milenin, A.; Tao, Z.; Hody, H.; Altamirano Sanchez, E.; Veloso, A.; Witters, L.; Waldron, N.; Ragnarsson, L.; Kim, M.; Kikuchi, Y.; Mertens, H.; Raghavan, P.; Piumi, D.; Collaert, N.; Barla, K. and Thean, A.
Advanced Etch Technology for Nanopatterning V, p. 978209

Multimode resistive switching in nanoscale hafnium oxide stack as studied by atomic force microscopy
Hou, Y.; Celano, U.; Goux, L.; Liu, L.; Degraeve, R.; Cheng, Y.; Kang, J.; Jurczak, G. and Vandervorst, W.
Applied Physics Letters 109 (2), p. 23508

Sub-10 nm low current resistive switching behavior in hafnium oxide stack
Hou, Y.; Celano, U.; Goux, L.; Liu, L.; Fantini, A.; Degraeve, R.; Youssef, A.; Xu, Z.; Cheng, Y.; Kang, J.; Jurczak, M. and Vandervorst, W.
Applied Physics Letters 108 (12), p. 123106

Topological to trivial insulating phase transition in stanene
Houssa, M.; van den broek, B.; Iordanidou, K.; Lu, A.; Pourtois, G.; Locquet, J.; Afnanas’ev, V. and Stesmans, A.
Nano Research 9 (3), p. 774 - 778

Broadband 10Gb/s operation of graphene electro-absorption modulator on silicon
Hu, Y.; Pantouvaki, M.; Van Campenhout, J.; Brems, S.; Asselberghs, I.; Huyghebaert, C.; Absil, P. and Van Thourhout,D.
Laser & Photonics Reviews 10 (2), p. 307 - 316

Toward the 5nm technology: layout optimization and performance benchmark for logic/SRAMs using lateral and vertical GAA FETs
Huynh Bao, T.; Ryckaert, J.; Sakhare, S.; Mercha, A.; Verkest, D.; Thean, A. and Wambacq, P.
Design-Process-Technology Co-optimization for Manufacturability X, p. 978102

A comprehensive benchmark and optimization of 5-nm lateral and vertical GAA 6T-SRAMs
Huynh Bao, T.; Sakhare, S.; Yakimets, D.; Ryckaert, J.; Thean, A.; Mercha, A.; Verkest, D.
IEEE Transactions on Electron Devices 63 (2), p. 643 - 651

Structural and electrical properties of low temperature CVD-grown SiGe epitaxial layers
Ike, S.; Simoen, E.; Shimura, Y.; Hikavyy, A.; Vandervorst, W.; Loo, R.; Takeuchi, W.; Nakatsuka, O. and Zaima, S.
9th International Workdhop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar "Atomically

Influence of precursor gas on SiGe epitaxial material quality in terms of structural and electrical defects
Ike, S.; Simoen, E.; Shimura, Y.; Hikavyy, A.; Vandervorst, W.; Loo, R.; Takeuchi, W.; Nakatsuka, O. and Zaima, S.
Japanese Journal of Applied Physics 55 (4S), p. 04EJ11

Impact of point defects on the electronic and transport properties of silicene nanoribbons
Iordanidou, K.; Houssa, M.; van den Broek, B.; Pourtois, G.; Afanas'ev, V. and Stesmans, A.
Journal of Physics: Condensed Matter 28 (3), p. 35302

Growth mechanisms for Si epitaxy on O atomic layers: impact of O-content and surface structure
Jayachandran, S.; Billen, A.; Douhard, B.; Conard, T.; Meersschaut, J.; Moussa, A.; Caymax, M.; Bender, H.; Vandervorst, W.
Applied Surface Science 384, p. 152 - 160

Quasi two-dimensional Si-O superlattices: Atomically controlled growth and electrical properties
Jayachandran, S.; Simoen, E.; Martens, K.; Meersschaut, J.; Caymax, M.; Vandervorst, W.; Heyns, M. and Delabie, A.
ECS Journal of Solid State Science and Technology 5 (7), p. P396 - P403

Design strategy for integrating DSA via patterning in sub-7 nm interconnects
Karageorgos, I.; Ryckaert, J.; Tung, C.; Wong, H.; Gronheid, R.; Bekaert, J.; Croes, K.; Karageorgos, E.; Vandenberghe, G.; Stucchi, M. and Dehaene, W.
Design-Process-Technology Co-optimization for Manufacturability X, p. 97810N

Electrical characteristics of P-type bulk Si fin field-effect transistor using solid-source doping with 1-nm phosphosilicate glass Kikuchi, Y.; Chiarella, T.; De Roest, D.; Blanquart, T.; De Keersgieter, A.; Kenis, K.; Peter, A.; Ong, P.; Van Besien, E.; Tao, Z.; Kim, M.; Kubicek, S.; Chew, S.; Schram, T.; Demuynck, S.; Mocuta, A.; Mocuta, D. and Horiguchi, N. 
IEEE Electron Device Letters 37 (9), p. 1084 - 1087

Evaluation of via density and low-k Young’s modulus influence on mechanical performance of advanced node multi-level Back-End-Of-Line
Kljucar, L.; Gonzalez, M.; De Wolf, I.; Croes, K.; Boemmels, J. and Tokei, Z. 
Microelectronics Reliability 56, p. 93 - 100

Impact of PVD barrier deposition sequence on ultra low-k dielectrics
Krishtab, M.; Witters, T.; De Gendt, S. and Baklanov, M.
Materials for Advanced Metallization Conference - MAM, p. 113 - 114

EUV process establishment through litho and etch for N7 node
Kuwahara, Y.; Kawakami, S.; Kubota, M.; Matsunaga, K.; Nafus, K.; Foubert, P. and Mao, M.
Extreme Ultraviolet (EUV) Lithography VII, p. 97760C

Characterization of patterned porous low-k dielectrics: surface sealing and residue removal by wet processing/cleaning
Le, Q.; Kesters, E.; Decoster, S.; Chan, B.; Nguyen, M.; Conard, T.; Vanleenhove, A.; Holsteyns, F. and De Gendt, S.
ECS Journal of Solid State Science and Technology 5 (3), p. N5 - N9

Hybrid overlay metrology for high order correction by using CDSEM
Leray, P.; Halder, S.; Lorusso, G.; Baudemprez, B.; Inoue, O. and Okagawa, Y.
Metrology, Inspection, and Process Control for Microlithography XXX, p. 977824

Impact of Mn-based barriers on dielectric breakdown voltage and capacitance
Lesniewska, A.; Wu, C.; Jourdan, N.; Briggs, B.; Boemmels, J.; Tokei, Z. and Croes, K.
Materials for Advanced Metallization Conference - MAM, p. 101 - 102

[Co/Ni]-CoFeB hybrid free layer stack materials for high density magnetic random access memory applications
Liu, E.; Swerts, J.; Couet, S.; Mertens, S.; Tomczak, Y.; Lin, T.; Spampinato, V.; Franquet, A.; Van Elshocht, S.; Kar, G.; Furnemont, A. and De Boeck, J.
Applied Physics Letters 108 (13), p. 132405

Interplay between magnetocrystalline anisotropy and exchange bias in epitaxial CoO/Co films
Liu, H.; Brems, S.; Zeng, Y.; Temst, K.; Vantomme, A. and Van Haesendonck, C.
Journal of Physics: Condensed Matter 28 (19), p. 196002

Comprehensive understanding of charge lateral migration in 3D SONOS memories
Liu, L.; Arreghini, A.; Van den Bosch, G.; Pan, L. and Van Houdt, J.
Solid-State Electronics 116, p. 95 - 99

Ge epitaxial growth in view of optical device applications
Loo, R.; Srinivasan, A.; Shimura, Y.; Porret, C.; Van Thourhout, D.; Van Deun, R.; Stoica, T.; Buca, D. and Van Campenhout, J.
9th International Workshop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar "Atomically

Origin of the performances degradation of 2D-based MOSFETs in the sub-10 nm regime: a first-principles study
Lu, A.; Pourtois, G.; Agarwal, S.; Afzalian, A.; Radu, I. and Houssa, M.
Applied Physics Letters 108 (4), p. 43504

Saturation Photo-Voltage methodology for semiconductor insulator interface trap spectroscopy
Madia, O.; Afanasiev, V.; Cott, D.; Arimura, H.; Schulte-Braucks, C.; Lin, D.; Buca, D.; Von Den Criesch, N.; Nyns, L.; Ivanov, T.; Cuypers, D. and Stesmans, A.
ECS Journal of Solid State Science and Technology 5 (4), p. P3031 - P3036

Fast transient convolution-based thermal modeling methodology for including the package thermal impact in 3D-ICs
Maggioni, F.; Oprins, H.; Beyne, E.; De Wolf, I. and Baelmans, M.
IEEE Transactions on Components, Packaging and Manufacturing Technology 6 (3), p. 424 - 431

Spin torque majority gate devices: towards 300mm wafer integration
Manfrini, M.; Vaysset, A.; Ciubotaru, F.; Yan, J.; Radisic, D.; Ercken, M.; Trivkovic, D.; Swerts, J.; Briggs, B.; Wilson, C.; Lin, D.; Mocuta, A.; Nikovov, D.; Sayan, S.; Manipatruni, S.; Young, I.; Radu, I. and Thean, A.
2016 Joint MMM-Intermag Conference

Ge1-xSnx and SiyGe1-x-ySnx epitaxy on a commercial CVD reactor
Margetis, J.; Mosleh, A.; Ghetmiri, S.; Bhargava, N.; Yu, S.; Profijt, H.; Kohen, D.; Loo, R.; Vohra, A. and Tolle, J.
7th International Symposium on Control of Semiconductor Interfaces / International Si Technology and Device Meeting,p. 4 - 5

IEEE Std P1838: DfT standard-under-development for 2.5D-, 3D-, and 5.5D-SICs
Marinissen, E.; McLaurin, T. and Jiao, H.
IEEE European Test Symposium - ETS, p. 1 - 10

Perpendicular magnetic anisotropy of Co/Pt on HfO2 template
Martens, K.; Swerts, J.; Rampelberg, G.; Mertens, S.; Couet, S.; Tomczak, Y.; Radu, I.; Detavernier, C. and Thean, A.
MMM Intermag

Comparative study of vertical GAA TFETs and GAA MOSFETs in function of the inversion coefficient
Martino, J.; Sivieri, V.; Agopian, P.; Rooyackers, R.; Vandooren, A.; Simoen, E.; Thean, A. and Claeys, C.
Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, p. P11

Performance of TFET and FinFET devices applied to current mirrors for different dimensions and temperatures
Martino, M.; Martino, J.; Agopian, P.; Rooyackers, R.; Vandooren, A.; Simoen, E.; Thean, A. and Claeys, C.
Semiconductor Science and Technology 31 (5), p. 55001

Influence of the Ge amount at the source on transistor efficiency of vertical gate all around TFETs for different conduction regimes
Mendes Bordallo, C.; Sivieri, V.; Martino, J.; Agopian, P.; Rooyackers, R.; Vandooren, A.; Simoen, E.; Thean, A. and Claeys, C.
Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon -ULIS, p. P23

Self-aligned double patterning process for subtractive Ge Fin fabrication at 45-nm pitch
Milenin, A.; Witters, L.; Barla, K. and Thean, A.
Thin Solid Films 602, p. 64 - 67

A 2nd generation of 14/16nm-node compatible strained-Ge pFINFET with improved performance with respect to advanced Si-channel FinFETs
Mitard, J.; Witters, L.; Sasaki, Y.; Arimura, H.; Schulze, A.; Loo, R.; Ragnarsson, L.; Hikavyy, A.; Cott, D.; Chiarella, T.; Kubicek, S.; Mertens, H.; Ritzenthaler, R.; Vrancken, C.; Favia, P.; Bender, H.; Horiguchi, N.; Barla, K.; Mocuta, D.; Mocuta, A.; Collaert, N. and Thean, A.
Symposium on VLSI Technology, p. 34 - 35

Assist features: placement, impact and relevance
Mochi, I.; Philipsen, V.; Gallagher, E.; Hendrickx, E.; Lyakhova, K.; Wittebrood, F.; Schiffelers, G.; Fliervoet, T.; Wang, S.; Hsu, S.; Plachecki, V.; Baron, S. and Laenens, B.
Extreme Ultraviolet (EUV) Lithography VII, p. 97761S

Fundamental study of the apparent voltage-dependence of NBTI kinetics by constant electric field stress in Si and SiGe devices
Mukhopadhyay, S.; Franco, J.; Vaisman Chasin, A.; Roussel, P.; Kaczer, B.; Groeseneken, G.; Horiguchi, N.; Linten, D. and Thean, A.
IEEE International Reliability Physics Symposium - IRPS, p. 5A.3

Atomically controlled processing for Si and Ge CVD epitaxial growth
Murota, J.; Yamamoto, Y.; Costina, I.; Tillack, B.; Le Thanh, V.; Loo, R. and Caymax, M.
Dielectrics for Nanosystems 7: Materials Science, Processing, Reliability, and Manufacturing, p. 71 - 82

The effect of the substrate characteristics on the electrochemical nucleation and growth of copper
Nagar, M.; Radisic, A.; Strubbe, K. and Vereecken, P.
Journal of the Electrochemical Society 163 (12), p. D3053 - D3061

Low frequency noise analysis and modeling in vertical tunnel FETs with Ge Source
Neves, F.; Agopian, P.; Martino, J.; Cretu, B.; Rooyackers, R.; Vandooren, A.; Simoen, E.; Thean, A. and Claeys, C.
IEEE Transactions on Electron Devices 63 (4), p. 1658 - 1665

Electrical effect of a single extended defect in MOSFETs: a simulation study
Ni, K.; Eneman, G.; Simoen, E.; Mocuta, A.; Collaert, N.; Thean, A.; Schrimpf, R.; Reed, R. and Fleetwood, D. 
IEEE Transactions on Electron Devices 63 (8), p. 3069 - 3075

Extraction of elastic modulus of porous ultra-thin low-k films by two-dimensional finite-element simulations of nanoindentation
Okudur, O.; Vanstreels, K.; De Wolf, I. and Hangen, U.
Journal of Applied Physics 119 (2), p. 25302

GR-noise characterization of Ge pFinFETs with STI first and STI last process
Oliveira, A.; Simoen, E.; Mitard, J.; Agopian, P.; Martino, J.; Langer, R.; Witters, L.; Collaert, N.; Thean, A. and Claeys, C.
IEEE Electron Device Letters 37 (9), p. 1092 - 1095

Experimental characterization of the vertical and lateral heat transfer in 3D stacked IC packages
Oprins, H.; Cherman, V.; Van der Plas, G.; De Vos, J. and Beyne,E.
Journal of Electronic Packaging 138 (1), p. 11005

50Gb/s silicon photonics platform for short-reach optical interconnects
Pantouvaki, M.; De Heyn, P.; Rakowski, M.; Verheyen, P.; Snyder, B.; Srinivasan, A.; Chen, H.; De Coster, J.; Lepage, G.; Absil, P. and Van Campenhout, J.
Optical Fiber Communication Conference - OFC, p. Th4H

Improved cost-effectiveness of the block co-polymer anneal process for DSA
Pathangi Sriraman, H.; Stokhof, M.; Knaepen, W.; Vaid, V.; Mallik, A.; Chan, B.; Vandenbroeck, N.; Maes, J. and Gronheid, R.
Alternative Lithographic Technologies VIII, p. 97771Z

DSA materials contributions to the defectivity performance of the 14nm half-pitch LiNe flow @ imec
Pathangi Sriraman, H.; Vaid, V.; Chan, B.; Vandenbroeck, N.; Li, J.; Hong, S.; Cao, Y.; Durairaj, B.; Lin, G.; Somervell, M.; Kitano, T.; Harukawa, R.; Sah, K.; Cross, A.; Bayana, H.; D'Urzo, L. and Gronheid, R.
Alternative Lithographic Technologies VIII, p. 97770G

Phase analysis and thermal stability of thin films synthesized via solid state reaction of Ni with Si1-xGex substrate
Peter, A.; Witters, T.; Dutta, S.; Hikavyy, A.; Vaesen, I.; Van Elshocht, S. and Schaekers, M.
Microelectronic Engineering 149, p. 46 - 51

Characterization of ultra-thin nickel-silicide films synthesized using the solid state reaction of Ni with an underlying Si:P substrate (P: 0.7 to 4.0%)
Peter, A.; Yu, H.; Dutta, S.; Rosseel, E.; Van Elshocht, S.; Paulussen, K.; Moussa, A.; Vaesen, I. and Schaekers, M.
Microelectronic Engineering 157, p. 52 - 59

Single- and multilayer graphene wires as alternative interconnects
Politou, M.; Asselberghs, I.; Soree, B.; Lee, C.; Sayan, S.; Lin, D.; Pashaei, P.; Huyghebaert, C.; Raghavan, P.; Radu, I.; Tokei, Z.; De Gendt, S. and Heyns, M.
Microelectronic Engineering 156, p. 131 - 135

Electrical characterization of multilayer graphene ribbons with Pd edge contacts for advanced interconnects
Politou, M.; Asselberghs, I.; Wu, X.; Radu, I.; Huyghebaert, C.; Tokei, Z.; De Gendt, S. and Heyns, M.
Materials for Advanced Metallization - MAM

Low leakage stoichiometric SrTiO3 dielectric for advanced metal-insulator-metal capacitors
Popovici, M.; Kaczer, B.; Afanasiev, V.; Sereni, G.; Larcher, L.; Redolfi, A.; Van Elshocht, S. and Jurczak, M.
Physica Status Solidi. Rapid Research Letters 10 (5), p. 420 - 425

Metal stack optimization for low-power and high-density for N7-N5
Raghavan, P.; Firouzi, F.; Matti, L.; Debacker, P.; Baert, R.; Sherazi, Y.; Trivkovic, D.; Gerousis, V.; Dusa, M.; Ryckaert, J.; Tokei, Z.; Verkest, D.; McIntyre, G. and Ronse, K.
Design-Process-Technology Co-optimization for Manufacturability X, p. 97810Q

5nm: has the time for a device change come?
Raghavan, P.; Garcia Bardon, M.; Schuddinck, P.; Jang, D.; Yakimets, D.; Baert, R.; Debacker, P.; Verkest, D. and Thean, A.
17th International Symposium on Quality Electronic Design - ISQED, p. 275 - 277

Zero-thickness multi work function solutions for N7 bulk FinFETs
Ragnarsson, L.; Dekkers, H.; Matagne, P.; Schram, T.; Conard, T.; Horiguchi, N. and Thean, A.
Symposium on VLSI Technology, p. 98 - 99

Top-down InGaAs nanowire and Fin vertical FETs with record performance
Ramesh, S.; Ivanov, T.; Camerotto, E.; Sun, N.; Franco, J.; Sibaja-Hernandez, A.; Rooyackers, R.; Alian, A.; Loo, J.; Veloso, A.; Milenin, A.; Lin, D.; Favia, P.; Bender, H.; Collaert, N.; Thean, A. and De Meyer, K.
Symposium on VLSI Technology, p. 164 - 165

Supercritical carbon dioxide etching of transition metal (Cu, Ni, Co, Fe) thin films
Rasadujjaman, M.; Nakamura, Y.; Watanabe, M.; Kondoh, E. and Baklanov, M.
Microelectronic Engineering 153, p. 5 - 10

UV cure of oxycarbosilane low-k films
Redzheb, M.; Prager, L.; Krishtab, M.; Armini, S.; Vanstreels, K.; Franquet, A.; Van der Voort, P. and Baklanov, M.
Microelectronic Engineering 156, p. 103 - 107

Effect of the C-bridge length on the ultraviolet-resistance of oxycarbosilane low-k films
Redzheb, M.; Prager, L.; Naumov, S.; Armini, S.; Voort, P.; Krishtab, M. and Baklanov, M.
Applied Physics Letters 108 (1), p. 12902

Understanding charge traps for optimizing Si-passivated Ge nMOSFETs
Ren, P.; Gao, R.; Ji, Z.; Arimura, H.; Zhang, J.; Wang, R.; Duan, M.; Zhang, W.; Franco, J.; Sioncke, S.; Cott, D.; Mitard, J.; Witters, L.; Mertens, H.; Kaczer, B.; Mocuta, A.; Collaert, N.; Linten, D.; Huang, R.; Thean, A. and Groeseneken, G.
Symposium on VLSI technology, p. 32 - 33

Diffusion and gate replacement: a new gate-first high-k/metal gate CMOS integration scheme suppressing gate height symmetry
Ritzenthaler, R.; Schram, T.; Spessot, A.; Caillat, C.; Cho, M.; Simoen, E.; Aoulaiche, M.; Albert, J.; Chew, S.; Noh, K.; Son, Y.; Mitard, J.; Mocuta, A.; Horiguchi, N.; Fazan, P. and Thean, A.
IEEE Transactions on Electron Devices 63 (1), p. 265 - 271

Strained c:Si0.55Ge0.45 with Embedded e:Si0.75Ge0.25 S/D IFQW SiGe-pFET for DRAM periphery applications
Ritzenthaler, R.; Schram, T.; Witters, L.; Mitard, J.; Spessot, A.; Caillat, C.; Hellings, G.; Eneman, G.; Aoulaiche, M.; Na, H.; Son, Y.; Noh, K.; Fazan, P.; Lee, S.; Collaert, N.; Mocuta, A.; Horiguchi, N. and Thean, A.
Materials Science in Semiconductor Processing 42 (2), p. 255 - 258

Semi-empirical interconnect resistance model for advanced technology nodes
Roussel, P.; Ciofi, I.; Degraeve, R.; Vega Gonzalez, V.; Jourdan, N.; Baert, R.; Linten, D.; Boemmels, J.; Tokei, Z.; Groeseneken, G. and Thean, A.
IEEE International Reliability Physics Conference - IRPS, p. IT-2

Complete extraction of defect bands responsible for instabilities in n and pFinFETs
Rzepa, G.; Waltl, M.; Goes, W.; Kaczer, B.; Franco, J.; Chiarella, T.; Horiguchi, N. and Grasser, T.
Symposium on VLSI Technology, p. 208 - 209

Chemical mechanical polishing of manganese (Mn)-based barrier films in the BEOL interconnects for advanced metallization nodes
Sagi, K.; Babu, S.; van der Veen, M.; Struyf, H. and Teugels, L.
Materials for Advanced Metallization Conference - MAM, p. 147 - 148

CTE measurements for 3D package substrates using digital image correlation
Salahouelhadj, A. and Gonzalez, M.
17th Int. Conf. on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectr. and Microsyst. - EuroSimE

A first principles study of the oscillatory behavior of tunnel magnetoresitance: On the impact of magnetic and tunneling barrier layers and of the capping metals
Sankaran, K.; Swerts, J.; Couet, S.; Furnemont, A.; Stokbro, K. and Pourtois, G.
13th Joint MMM-Intermag Conference, p. FB-07

Toward sub-20nm pitch Fin patterning and integration with DSA
Sayan, S.; Marzook, T.; Chan, B.; Vandenbroeck, N.; Singh, A.; Laidler, D.; Altamirano Sanchez, E.; Leray, P.; Rincon Delgadillo, P.; Gronheid, R.; Vandenberghe, G.; Clark, W. and Juncker, A.
Advances in Patterning Materials and Processes XXXIII, p. 97790R

EUV extendibility via dry development rinse process
Sayan, S.; Tao, Z.; De Simone, D. and Vandenberghe, G. 
Extreme Ultraviolet (EUV) Lithography VII, p. 977610

Impact of on- and off-chip protection on the transient-induced latch-up sensitivity of CMOS IC
Scholz, M.; Chen, S.; Hellings, G.; Linten, D. and Groeseneken, G.
Microelectronics Reliability 57, p. 53 - 58

Design requirements for group-IV laser based on fully strained Ge1-xSnx embedded in partially relaxed Si1-y-zGeySnz buffer layers
Shimura, Y.; Srinivasan, A. and Loo, R.
ECS Journal of Solid State Science and Technology 5 (5), p. Q140 - Q143

Highly activated phosphorus in CVD Ge layers using in-situ doping at low temperature enabled by high order Ge precursors: toward Group-IV optical interconnections
Shimura, Y.; Srinivasan, A.; Van Thourhout, D.; Van Deun, R.; Pantouvaki, M.; Van Campenhout, J. and Loo, R.
9th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar "Atomically

Enhanced active P doping by using high order Ge precursors leading to intense photoluminescence
Shimura, Y.; Srinivasan, A.; Van Thourhout, D.; Van Deun, R.; Pantouvaki, M.; Van Campenhout, J. and Loo, R.
Thin Solid Films 602, p. 56 - 59

Comparative experimental analysis of time-dependent variability using a transistor test array
Simicic, M.; Subirats, A.; Weckx, P.; Kaczer, B.; Franco, J.; Roussel, P.; Linten, D.; Thean, A.; Groeseneken, G. and Gielen, G.
IEEE International Reliability Physics Symposium - IRPS, p. XT-10

Low-frequency noise spectroscopy of bulk and border traps in nanoscale devices
Simoen, E.; Cretu, B.; Fang, W.; Aoulaiche, M.; Routoure, J.; Carin, R.; Luo, J.; Zhao, C. and Claeys, C.
16th Gettering and Defect Engineering in Semiconductors Conference - GADEST, p. 449 - 458

Study of electrically active defects in epitaxial layers on silicon
Simoen, E.; Dhayalan, S.; Jayachandran, S.; Gupta, S.; Gencarelli, F.; Hikavyy, A.; Loo, R.; Rosseel, E.; Delabie, A.; Caymax, M.; Langer, R.; Barla, K.; Vrielinck, H. and Lauwaert, J.
China Semiconductor Technology International Conference - CSTIC Symposium IV: Thin Film and Process Integration

Impact of the gate material on the deep levels in a-Si:H/c-SI metal-insulator-semiconductor capacitors
Simoen, E.; Ferro, V. and O'Sullivan, B. 
16th Gettering and Defect Engineering in Semiconductors Conference - GADEST XVI, p. 61 - 66

Deep levels in silicon-oxygen superlattices
Simoen, E.; Jayachandran, S.; Delabie, A.; Caymax, M. and Heyns, M.
Semiconductor Science and Technology 31 (2), p. 25015

Low-frequency noise assessment of the oxide trap density in thick-oxide input-output transistors for DRAM applications
Simoen, E.; Ritzenthaler, R.; Cho, M.; Schram, T.; Horiguchi, N.; Aoulaiche, M.; Spessot, A.; Fazan, P. and Claeys, C.
ECS Journal of Solid State Science and Technology 5 (6), p. N27 - N31

56Gb/s germanium waveguide electro-absorption modulator
Srinivasan, A.; Pantouvaki, M.; Gupta, S.; Chen, H.; Verheyen, P.; Lepage, G.; Roelkens, G.; Saraswat, K.; Van Thourhout, D.; Absil, P. and Van Campenhout, J.
Journal of Lightwave Technology 34 (2), p. 419 - 424

Laser annealed in-situ P-doped Ge for on-chip laser source applications
Srinivasan, A.; Pantouvaki, M.; Shimura, Y.; Porret, C.; Van Deun, R.; Loo, R.; Van Thourhout, D. and Van Campenhout, J.
Silicon Photonics and Photonic Integrated Circuits V, p. 98911U

Extraction of carrier lifetime in Ge waveguides using pump probe spectroscopy
Srinivasan, A.; Pantouvaki, M.; Verheyen, P.; Lepage, G.; Absil, P.; Van Campenhout, J. and Van Thourhout, D.
Applied Physics Letters 108 (21), p. 21101

50Gb/s C-band GeSi waveguide electro-absorption modulator
Srinivasan, A.; Verheyen, P.; Loo, R.; De Wolf, I.; Pantouvaki, M.; Lepage, G.; Balakrishnan, S.; Vanherle, W.; Absil, P. and Van Campenhout, J.
Optical Fiber Communications Conference - OFC, p. Tu3D.7

In depth analysis of post-program VT instability after electrical stress in 3D SONOS memories
Subirats, A.; Arreghini, A.; Van den Bosch, G.; Degraeve, R.; Linten, D. and Furnemont, A.
International Memory Workshop - IMW, p. 84 - 87

Channel and near channel defects characterization in vertical InxGa1-xAs high mobility channels for future 3D NAND memory
Subirats, A.; Capogreco, E.; Degraeve, R.; Arreghini, A.; Van den Bosch, G.; Linten, D.; Van Houdt, J. and Furnemont, A.
IEEE Reliability Physics Symposium - IRPS, p. 6C.4

The influence of solvents on the quality of SAMs for low-k pore sealing purpose
Sun, Y.; de Roover, R.; Struyf, H.; De Feyter, S. and Armini, S. Materials for Advanced Metallization Conference - MAM, p. 115 - 116

Surface-confined activation of ultra low-k dielectrics in CO2 plasma
Sun, Y.; Krishtab, M.; Mankelevich, Y.; Zhang, L.; De Feyter, S.; Baklanov, M. and Armini, S.
Applied Physics Letters 108 (26), p. 262902

CMP processing of high-mobility channel material alternatives to Si Teugels, L. and Ong, P.
Advances in Chemical Mechanical Planarization (CMP), p. 119 - 136

On-chip interconnect trends, challenges and solutions: how to keep RC and reliability under control
Tokei, Z.; Ciofi, I.; Roussel, P.; Debacker, P.; Raghavan, P.; van der Veen, M.; Jourdan, N.; Wilson, C.; Vega Gonzalez, V.; Adelmann, C.; Wen, L.; Croes, K.; Varela Pedreira, O.; Moors, K.; Krishtab, M.; Armini, S. and Boemmels, J.
Symposium on VLSI Technology, p. 181 - 182

A Co/Ni-based perpendicular magnetic tunnel junction (p-MTJ) stack with improved reference layer for BEOL compatibility
Tomczak, Y.; Lin, T.; Swerts, J.; Couet, S.; Mertens, S.; Liu, E.; Kim, W.; Sankaran, K.; Pourtois, G.; Tsvetanova, D.; Souriau, L.; Van Elshocht, S.; Kar, G. and Furnemont, A.
MMM Intermag

Thin Co/Ni-based bottom pinned spin-transfer torque magnetic random access memory stacks with high annealing tolerance
Tomczak, Y.; Swerts, J.; Mertens, S.; Lin, T.; Couet, S.; Liu, E.; Sankaran, K.; Pourtois, G.; Kim, W.; Souriau, L.; Van Elshocht, S.; Kar, G. and Furnemont, A.
Applied Physics Letters 108 (4), p. 42402

Design strategy for layout of Sub-Resolution Directed Self-Assembly Assist Features (SDRAFs)
Tung, C.; Doise, J.; Karageorgos, I.; Ryckaert, J. and Wong, H.
Electron, Ion, and Photon Beam Technology and Nanofrabrication - EIPBN, p. 5C4

Surface sealing using self-assembled monolayers and its effect on metal diffusion in porous low-k dielectrics studied using monoenergetic positron beams
Uedono, A.; Armini, S.; Zhang, Y.; Kakizaki, T.; Krause-Rehberg, R.; Anwand, W. and Wagner, A.
Applied Surface Science 368, p. 272 - 276

Record mobility (µeff ~3100 cm2/V-s) and reliability performance (Vov~0.5V for 10yr operation) of In0.53Ga0.47As MOS devices using improved surface preparation and a novel interfacial layer
Vais, A.; Alian, A.; Nyns, L.; Franco, J.; Sioncke, S.; Putcha, V.; Yu, H.; Mols, Y.; Rooyackers, R.; Lin, D.; Maes, J.; Xie, Q.; Givens, M.; Tang, F.; Jiang, X.; Mocuta, A.; Collaert, N.; De Meyer, K. and Thean, A.
Symposium on VLSI Technology, p. 140 - 141

Hot-carrier analysis on nMOS Si finFETs with solid source doped junctions
Vaisman Chasin, A.; Franco, J.; Ritzenthaler, R.; Hellings, G.; Cho, M.; Sasaki, Y.; Subirats, A.; Roussel, P.; Kaczer, B.; Linten, D.; Horiguchi, N.; Groeseneken, G. and Thean, A.
IEEE International Reliaability Physics - IRPS , p. 4B.4

Impact of wafer thinning on front-end reliability for 3D integration
Vaisman Chasin, A.; Scholz, M.; Guo, W.; Franco, J.; Potoms, G.; Jourdain, A.; Linten, D.; Van der Plas, G.; Absil, P. and Beyne, E.
IEEE Reliability Physics Symposium - IRPS, p. 6B.2

Thermal stability extraction from single perpendicular MTJs and Mbit arrays: comparison and statistical analysis
Van Beek, S.; Martens, K.; Roussel, P.; Kim, W.; Swerts, J.; Donadio, G.; Kar, G.; Thean, A.; Furnemont, A. and Groeseneken,G.
MMM-Intermag

Inter-ribbon tunneling in graphene: an atomistic Bardeen approach
Van de Put, M.; Vandenberghe, W.; Soree, B.; Magnus, W. and Fischetti, M.
Journal of Applied Physics 119 (21), p. 214306

Functional silicene and stanene nanoribbons compared tographene: electronic structure and transport
van den Broek, B.; Houssa, M.; Iordadidou, K.; Pourtois, G.; Afanas'ev, V. and Stesmans, A.
2D Materials 3 (1), p. 15001

Conformal Cu electroless seed on Co and Ru liners enables Cu fill by plating for advanced interconnects
van der Veen, M.; Inoue, F.; Vandersmissen, K.; Dictus, D.; Tetsu, T.; Boemmels, J.; Struyf, H. and Tokei, Z.
Materials for Advanced Metalization - MAM

Barrier/liner stacks for scaling the Cu interconnect metallization
van der Veen, M.; Jourdan, N.; Vega Gonzalez, V.; Wilson, C.; Heylen, N.; Varela Pedreira, O.; Struyf, H.; Croes, K.; Boemmels, J. and Tokei, Z.
IEEE International Interconnect Technology Conference / Advanced Metallization Conference - IITC/AMC, p. 28 - 30

The development of an EUVL pellicle comprising carbon nanomaterials Vanpaemel, J.; Lee, J.; Krishnaraj, C.; Pollentier, I.; Huyghebaert, C.; Adelmann, C. and Gallagher, E. Materials for Advanced Metallization Conference - MAM p. 165 - 166

Determination of thermal expansion coefficients of low-k dielectrics by cube corner indentation tests at elevated temperatures
Vanstreels, K.; Zahedmanesh, H.; Verdonck, P.; Hangen, U. and Baklanov, M.
Materials for Advanced Metallization Conference - MAM

Vertical nanowire FET integration and device aspects
Veloso, A.; Altamirano Sanchez, E.; Brus, S.; Chan, B.; Cupak, M.; Dehan, M.; Delvaux, C.; Devriendt, K.; Eneman, G.; Ercken, M.; Huynh Bao, T.; Ivanov, T.; Matagne, P.; Merckling, C.; Paraschiv, V.; Ramesh, S.; Rosseel, E.; Rynders, L.; Sibaja-Hernandez, A.; Suhard, S.; Tao, Z.; Vecchio, E.; Waldron, N.; Yakimets, D.; De Meyer, K.; Mocuta, D.; Collaert, N. and Thean, A.
Silicon Compatible Materials, Processes and Technologies for Advanced Integrated Circuits and Emerging Applications 6, p. 31 - 42

Gate-all-around nanowire FETs vs. triple-gate FinFETs: on gate integrity and device characteristics
Veloso, A.; Cho, M.; Simoen, E.; Hellings, G.; Matagne, P.; Collaert, N. and Thean, A.
Dielectrics for Nanosystems 7: Materials Science, Processing, Reliability, and Manufacturing, p. 85 - 95

Junctionless gate-all-around lateral and vertical nanowire FETs with simplified processing for advanced logic and analog/RF applications and scaled SRAM cells
Veloso, A.; Parvais, B.; Matagne, P.; Simoen, E.; Huynh Bao, T.; Paraschiv, V.; Vecchio, E.; Devriendt, K.; Rosseel, E.; Ercken, M.; Chan, B.; Delvaux, C.; Altamirano Sanchez, E.; Versluijs, J.; Tao, Z.; Suhard, S.; Brus, S.; Sibaja-Hernandez, A.; Waldron, N.; Lagrain, P.; Richard, O.; Bender, H.; Vaisman Chasin, A.; Kaczer, B.; Ivanov, T.; Ramesh, S.; De Meyer, K.; Ryckaert, J.; Collaert, N. and Thean, A.
Symposium on VLSI Technology p. 138 - 139

Scaling of Back End of Line Processing : opportunities and challenges Verdonck, P.; Wilson, C.; Ronse, K.; Wen, L. and Armini, S.
SEMINATEC

Epitaxial Al2O3(0001)/Cu(111) template development for CVD graphene growth
Verguts, K.; Vermeulen, B.; Vrancken, N.; Schouteden, K.; Van Haesendonck, C.; Huyghebaert, C.; Heyns, M.; De Gendt, S. and Brems, S.
Journal of Physical Chemistry C 120 (1), p. 297 - 304

Uniform strain in heterostructure tunnel field-effect transistors
Verreck, D.; Verhulst, A.; Van de Put, M.; Soree, B.; Collaert, N.; Mocuta, A.; Thean, A. and Groeseneken, G.
IEEE Electron Device Letters 37 (3), p. 337 - 340

Low frequency noise and fin width study of Si passivated Ge pFinFETs
Vinicius de Oliveira, A.; Simoen, E.; Ghedini Der Agopian, P.; Martino, J.; Mitard, J.; Witters, L.; Langer, R.; Collaert, N.; Claeys, C. and Thean, A.
China Semiconductor Technology International Conference - CSTIC Symposium I: Device Engineering and Technology

Effective hole mobility and low-frequency noise characterization of strained Ge pFinFETs
Vinicius de Oliveira, A.; Simoen, E.; Ghedini Der Agopian, P.; Martino, J.; Mitard, J.; Witters, L.; Langer, R.; Collaert, N.; Claeys, C. and Thean, A.
Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon - ULIS

Replacement fin processing for III-V on Si: From FinFets to nanowires
Waldron, N.; Merckling, C.; Teugels, L.; Ong, P.; Sebaai, F.; Barla, K.; Collaert, N. and Thean, A.
Solid-State Electronics 115 (Part B), p. 81 - 91

Process window and defect monitoring using high-throughput e-beam inspection guided by computational hot spot detection
Wang, F.; Zhang, P.; Fang, W.; Liu, K.; Jau, J.; Wang, L.; Wan, A.; Hunsche, S.; Halder, S. and Leray, P.
Metrology, Inspection, and Process Control for Microlithography XXX, p. 97783F

Role of local chemical potential of Cu on data retention properties of Cu-based conductive-bridge RAM
Woo, J.; Belmonte, A.; Redolfi, A.; Hwang, H.; Jurczak, M. and Goux, L.
IEEE Electron Device Letters 37 (2), p. 173 - 175

New breakdown mechanism investigation: barrier metal penetration induced soft breakdown in low-k dielectrics
Wu, C.; Li, Y.; Boemmels, J.; De Wolf, I.; Tokei, Z. and Croes, K.
IEEE International Reliability Physics Symposium - IRPS, p. 3A.2

The effects of vacuum-ultraviolet radiation on defects in low-k organosilicate glass
Xue, P.; Pei, D.; Zheng, H.; Li, W.; Afanas’ev, V.; Baklanov, M.; de Marneffe, J.; Lin, Y.; Fung, H.; Chen, C.; Nishi, Y. and Shohet, J.
Thin Solid Films 616, p. 23 - 26

Height uniformity of micro-bumps electroplated on thin Cu seed layers
Yang, L.; Slabbekoorn, J.; Honore, M.; Stiers, K.; Struyf, H.; Vereecken, P. and Radisic, A.
229th Electrochemical Society Meeting, p. 1179

Contact resistivities of metal-insulator-semiconductor contacts and metal-semiconductor contacts
Yu, H.; Schaekers, M.; Barla, K.; Horiguchi, N.; Collaert, N.; Thean, A. and De Meyer, K.
Applied Physics Letters 108 (17), p. 171602

Process options to enable (Sub-)1e-9 Ohm.cm2 contact resistivity on Si devices
Yu, H.; Schaekers, M.; Demuynck, S.; Rosseel, E.; Everaert, J.; Chew, S.; Peter, A.; Kubicek, S.; Barla, K.; Mocuta, A.; Horiguchi, N.; Collaert, N.; Thean, A. and De Meyer, K.
IEEE International Interconnect Technology Conference / Advanced Metallization Conference - IITC/AMC), p. 66 - 68

Ultralow-resistivity CMOS contact scheme with pre-contact amorphization plus Ti (germano-)silicidation
Yu, H.; Schaekers, M.; Hikavyy, A.; Rosseel, E.; Peter, A.; Hollar, K.; Khaja, F.; Aderhold, W.; Date, L.; Mayur, A.; Lee, J.; Shin, K.; Douhard, B.; Chew, S.; Demuynck, S.; Kubicek, S.; Kim, D.; Mocuta, A.; Barla, K.; Horiguchi, N.; Collaert, N.; Thean, A. and De Meyer, K.
Symposium on VLSI Technology, p. 66 - 67

Low-resistance titanium contacts and thermally unstable nickel germanide contacts on p-type germanium
Yu, H.; Schaekers, M.; Schram, T.; Aderhold, W.; Mayur, A.; Mitard, J.; Witters, L.; Barla, K.; Collaert, N.; Horiguchi, N.; Thean, A. and De Meyer, K.
IEEE Electron Device Letters 37 (4), p. 482 - 485

Thermal stability concern of metal-insulator-semiconductor contact: a case study of Ti/TiO2/n-Si contact
Yu, H.; Schaekers, M.; Schram, T.; Demuynck, S.; Horiguchi, N.; Barla, K.; Collaert, N.; Thean, A. and De Meyer, K.
IEEE Transactions on Electron Devices 63 (7), p. 2671 - 2676

Stress analysis of airgaps under process-induced thermomechanical loads
Zahedmanesh, H.; Gonzalez, M.; Ciofi, I.; Croes, K.; Boemmels, J. and Tokei, Z.
Microelectronic Engineering 156, p. 70 - 77

Design considerations for the mechanical integrity of airgaps in nano-interconnects under chip-package interaction; A numerical investigation
Zahedmanesh, H.; Gonzalez, M.; Ciofi, I.; Croes, K.; Boemmels, J. and Tokei, Z.
Microelectronics Reliability 59, p. 102 - 107

Mechanically conscious design of airgaps in nano-interconnects
Zahedmanesh, H.; Gonzalez, M.; Ciofi, I.; Croes, K.; Boemmels, J. and Tokei, Z.
Materials for Advanced Metalization - MAM

A numerical study on nano-indentation induced fracture of low dielectric constant brittle thin films using cube corner probes
Zahedmanesh, H.; Vanstreels, K. and Gonzalez, M.
Microelectronic Engineering 156, p. 108 - 115

Pitch walking assessment after self-aligned double patterning for the 10nm logic technology node
Zarate Rincon, F.; Vega Gonzalez,.Zarate Rincon, F.; Vega Gonzalez,; Ciofi, I.; Wilson, C.; van der Veen, M.; Roussel, P.; Boemmels, J.; Tokei, Z.; Torres, R. and Murphy, R.
Materials for Advanced Metallization Conference - MAM, p. PD-04

Mitigation of plasma-induced damage in porous low-k dielectrics by cryogenic precursor condensation
Zhang, L.; de Marneffe, J.; Leroy, F.; Lefaucheux, P.; Tillocher, T.; Dussart, R.; Maekawa, K.; Yatsuda, K.; Dussarrat, C.; Goodyear, A.; Cooke, M.; De Gendt, S. and Baklanov, M.
Journal of Physics D: Applied Physics 49 (17), p. 17

Toward successful integration of gap-filling ultralow-k dielectrics
Zhang, L.; de Marneffe, J.; Lesniewska, A.; Verdonck, P.; Heylen, N.; Murdoch, G.; Croes, K.; Tokei, Z.; Boemmels, J.; Lefferts, S.; De Gendt, S. and Baklanov, M.
IEEE International Interconnect Technology Conference / Advanced Metallization Conference - IITC/AMC, p. 21 - 23

Integration aspects of post-porosity low-k protection using PMMA sacrificial filler
Zhang, L.; de Marneffe, J.; Wen, L.; Wilson, C.; Tokei, Z.; Boemmels, J.; De Gendt, S. and Baklanov, M.
Materials for Advanced Metallization - MAM

Scalability of InGaAs nanowires demonstrating wire width down to 7nm and Lg down to 30nm fabricated on a 300mm Si platform
Zhou, D.; Waldron, N.; Boccardi, G.; Sebaai, F.; Merckling, C.; Eneman, G.; Sioncke, S.; Nyns, L.; Opdebeeck, A.; Maes, J.; Xie, Q.; Givens, M.; Tang, F.; Jiang, X.; Guo, W.; Kunert, B.; Teugels, L.; Devriendt, K.; Sibaja-Hernandez, A.; Franco, J.; van Dorp, D.; Barla, K.; Collaert, N. and Thean, A.
Symposium on VLSI Technology, p. 166 - 167

Ruthenium Atomic Layer Deposition (ALD)-enabled selectivity of Cobalt Electroless Layer Deposition (ELD) on dielectrics Zyulkov, I.; Krishtab, M.; De Gendt, S. and Armini, S. Materials for Advanced Metallizaiton Conference - MAM, p. 145 - 146

Heterogeneous integration

High speed direct modulation of a heterogeneously integrated InP/SOI DFB laser
Abassi, A.; Spatharakis, C.; Kanakis, G.; Andre, N.; Louchet, H.; Katumba, A.; Verbist, J.; Avramopoulos, H.; Bienstman, P.; Yin, X.; Bauwelinck, J.; Roelkens, G. and Morthier, G.
Journal of Lightwave Technology 34 (8), p. 1683 - 1687

PAM-4 and duobinary direct modulation of a hybrid InP/SOI DFB laser for 40 Gb/s transmission over 2 km single mode fiber
Abassi, A.; Spatharakis, C.; Kanakis, G.; Andre, N.; Louchet, H.; Katumba, A.; Verbist, J.; Yin, X.; Bauwelinck, J.; Avramopoulos, H.; Roelkens, G. and Morthier, G.
Optical Fiber Communication Conference - OFC, p. M2C.6

Silicon photonics: silicon nitride versus silicon-on-insulator
Baets, R.; Subramanian, A.; Clemmen, S.; Kuyken, B.; Bienstman, P.; Le Thomas, N.; Roelkens, G.; Van Thourhout, D.; Helin, P. and Severi, S.
Optical Fiber Communication Conference - OFC, p. Th3J.1

Fabrication and characterization of SiNx/Au nanopatch cavities with colloidal nanocrystals
Bisschop, S.; Geiregat, P.; Hens, Z.; Van Thourhout, D. and Brainis, E.
Conference on Lasers and Electro-Optics - CLEO, FTu4B.6

III-V-on-silicon integrated micro - spectrometer for the 3 µm wavelength range
Muneeb, M.; Vasiliev, A.; Ruocco, A.; Malik, A.; Chen, H.; Nedeljkovic, M.; Penades, J.; Cerutti, L.; Rodriguez, J.; mashanovich, G.; Smit, M.; Tourni, E. and Roelkens, G.
Optics Express 24 (9), p. 9465 - 9472

Challenges for designing large-scale integrated photonics
Bogaerts, W.
24th International Workshop on Optical Wave & Waveguide Theory and Numerical Modelling - OWTNM, p. OWTNM/I-01

The IPKISS photonic design framework
Bogaerts, W.; Fiers, M.; Sivilotti, M. and Dumon, P.
Optical Fiber Communication Conference - OFC, p. W1E

Scalable electro-photonic integration concept based on polymer waveguides
Bosman, E.; Van Steenberge, G.; Boersma, A.; Wiegersma, S.; Harmsma, P.; Karppinen, M.; Korhonen, T.; Offrein, B.; Dangel, R.; Daly, A.; Ortsiefer, M.; Justice, J.; Corbett, B.; Dorrestein, S. and Duis, J.
Optical Interconnects XVI, 97530G

(-1) V bias 67 GHz bandwidth si-contacted germanium waveguide p-i-n photodetector for optical links at 56 Gbps and beyond
Chen, H.; Verheyen, P.; De Heyn, P.; Lepage, G.; De Coster, J.; Balakrishnan, S.; Absil, P.; Yao, W.; Shen, L.; Roelkens, G. and Van Campenhout, J.
Optics Express 24 (5), p. 4622 - 4631

Observation of an optical event horizon in a silicon-on-insulator photonic wire waveguide
Ciret, C.; Leo, F.; Kuyken, B.; Roelkens, G. and Gorza, S.
Optics Express 24 (1), p. 114 - 124

A novel approach to an efficient LED on SOI
De Groote, A.; Cardile, P.; Subramanian, A.; Delbeke, D.; Baets, R. and Roelkens, G.
Proceedings of the 20th Annual Symposium of the IEEE Photonics Society Benelux Chapter, p. 103 - 106

Broadband and non-volatile liquid controlled silicon photonics switch D'heer, H.; Arce, C.; Watte, J.; Huybrechts, K.; Baets, R. and Van Thourhout, D.
Conference on Lasers and Electro-Optics - CLEO, SM3G.6

On-chip axicon for light sheet microscopy
Diaz Tormo, A. and Le Thomas, N.
Proceedings of the 20th Annual Symposium of the IEEE Photonics Society Benelux Chapter, p. 177 - 180

Reduction of peak input currents during charge pump boosting in monolithically integrated high-voltage generators
Doutreloigne, J.
International Journal of Electrical, Computer, Energetic, Electronic and Communication Engineering 10 (1), p. 46 - 51

50GHz Ge waveguide electro-absorption modulator integrated in a 220nm SOI photonics platform
Gupta, S.; Srinivasan, A.; Pantouvaki, M.; Chen, H.; Verheyen, P.; Lepage, G.; Van Thourhout, D.; Roelkens, G.; Saraswat, K.; Absil, P. and Van Campenhout, J.
Optical Fiber Communications Conference 2015 (OFC)

20 Gb/s modulation of silicon-integrated short-wavelength hybrid-cavity VCSELs
Haglund, E.; Kumari, S.; Westbergh, P.; Gustavsson, J.; Roelkens, G.; Baets, R. and Larsson, A.
IEEE Photonics Technology Letters 28 (8), p. 856 - 859

Dynamic properties of silicon-integrated short-wavelength hybrid-cavity VCSEL
Haglund, E.; Kumari, S.; Westbergh, P.; Gustavsson, J.; Roelkens, G.; Baets, R. and Larsson, A.
Vertical-Cavity Surface-Emitting Lasers XX, p. 976604

Optical interconnect with densely integrated plasmonic modulator and germanium photodetector arrays
Hoesbacher, C.; Salamin, Y.; Fedoryshyn, Y.; Heni, W.; Hosten, A.; Baeuerle, B.; Haffner, C.; Zahner, M.; Chen, H.; Elder, D.; Wehrli, S.; Hillerkuss, D.; Van Thourhout, D.; Van Campenhout, J.; Dalton, L.; Hafner, C. and Leuthold, J.
Optical Fiber Communication Conference - OFC

Quantitative analysis of TM lateral leakage in foundry fabricated silicon rib waveguides
Hope, A.; Nguyen, T.; Mitchell, A. and Bogaerts, W. 
IEEE Photonics Technology Letters 28 (4), p. 493 - 496

Improving the detection limit of conformational analysis by utilizing a dual polarization vernier cascade
Hoste, J.; Soetaert, P. and Bienstman, P.
Optics Express 24 (1), p. 67 - 81

Low driving voltage band-filling-based III-V-on-silicon electroabsorption modulator
Huang, Q.; Wu, Y.; Ma, K.; Zhang, J.; Xie, W.; Fu, X.; Shi, Y.; Chen, K.; He, J.; Van Thourhout, D.; Roelkens, G.; Liu, L. and He,S. 
Applied Physics Letters 108 (14), p. 14101

Micro-opto-mechanical pressure sensor (MOMPS) in SIN integrated photonics platform
Jansen, R.; Rochus, V.; Goyvaerts, J.; Vandenbosch, G.; Van de Voort, B.; Neutens, P.; O'Callaghan, J.; Tilmans, H. and Rottenberg, X.
TechConnect World Innovation Conference & Expo

Silicon-organic hybrid (SOH) and plasmonic-organic hybrid (POH) integration
Koos, C.; Leuthold, J.; Freude, W.; Kohl, M.; Dalton, L.; Bogaerts, W.; Giesecke, A.; Lauermann, M.; Melikyan, A.; Koeber, S.; Wolf, S.; Weimann, C.; Muehlbrandt, S.; Koehnle, K.; Pfeifle, J.; Hartmann, W.; Kutuvantavida, Y.; Ummethala, S.; Palmer, R.; Korn, D.; Alloatti, L.; Schindler, P.; Elder, D.; Wahlbrink, T. and Bolten, J.
Journal of Lightwave Technology 34 (2), p. 256 - 268

Integrated optical frequency shifter in silicon-organic hybrid (SOH) technology
Lauermann, M.; Weimann, C.; Knopf, A.; Heni, W.; Palmer, R.; Koeber, S.; Elder, D.; Bogaerts, W.; Leuthold, J.; Dalton, L.; Rembe, C.; Freude, W. and Koos, C.
Optics Express 24 (11), p. 11694 - 11707

Design of a single all-silicon ring resonator with a 150 nm FSR and a 100 nm tuning range around 1550 nm
Li, A.; Huang, Q. and Bogaerts, W.
Photonics Research 4 (2), p. 84 - 92

Backscattering in silicon microring resonators: a quantitative analysis
Li, A.; Van Vaerenbergh, T.; De Heyn, P.; Bienstman, P. and Bogaerts, W.
Laser & Photonics Reviews 10 (3), p. 420 - 431

A novel sensing scheme based on resonance splitting in silicon microrings
Li, A.; Xing, Y. and Bogaerts, W.
Proceedings of the 20th Annual Symposium of the IEEE Photonics Society Benelux Chapter, p. 187 - 190

Silicon-based photonic integrated circuits for the mid-infrared Malik, A.; Muneeb, M.; Radosavljevic, S.; Nedeljkovic, M.; Penades, J.; Mashanovich, G.; Shimura, Y.; Lepage, G.; Verheyen, P.; Vanherle, W.; Van Opstal, T.; Loo, R.; Van Campenhout, J. and Roelkens, G.
International Conference on Materials for Advanced Technologies - ICMAT 2015 – 4th Photonics Global Conference 2015, p. 144 - 151

Novelty low-cost integrated photonic biosensor using broadband source and on-chip spectral filter
Martens, D.; Stassen, A.; Van Roy, W. and Bienstman, P. 
Proceedings of the 20th Annual Symposium of the IEEE Photonics Society Benelux Chapter, p. 173 - 176

Nanoimprint fabrication of hybrid polymer microring resonators operating at very near infrared wavelengths
Morarescu, R.; Pal, P.; Beneitez, N.; Missinne, J.; Van Steenberge, G.; Bienstman, P. and Morthier, G.
18th European Conference in Integrated Optics, p. ECIO/p-03

Fabrication and characterization of high-optical-quality-factor hybrid polymer microring resonators operating at very near infrared wavelengths
Morarescu, R.; Pal, P.; Beneitez, N.; Missinne, J.; Van Steenberge, G.; Bienstman, P. and Morthier, G.
IEEE Photonics Journal 8 (2), p. 6600409

Surface enhanced Raman spectroscopy using a single mode nanophotonic-plasmonic platform
Peyskens, F.; Dhakal, A.; Van Dorpe, P.; Le Thomas, N. and Baets, R.
ACS Photonics 3 (1), p. 102 - 108

Surface enhanced raman spectroscopy on single mode nanophotonic-plasmonic waveguides
Peyskens, F.; Dhakal, A.; Van Dorpe, P.; Le Thomas, N. and Baets, R.
Conference on Lasers and Electro-Optics - CLEO, FM4N.7

A thermally tunable but athermal silicon MZI filter
Ribeiro, A.; Dwivedi, S. and Bogaerts, W. 
18th European Conference in Integrated Optics, p. ECIO/0-25

Design of a MZI micro-opto-mechanical pressure sensor for a SiN photonics platform
Rochus, V.; Jansen, R.; Goyvaerts, J.; Vandenboch, G.; van de Voort, B.; Neutens, P.; O'Callaghan, J.; Tilmans, H. and Rottenberg, X.
17th Int. Conf. on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectr. and Microsyst. - EuroSimE

Fabrication of substrate-less planar silicon photonic crystal cavities
Saurav, K. and Le Thomas, N.
Proceedings of the 20th Annual Symposium of the IEEE Photonics Society Benelux Chapter, p. 107 - 110

Switchable circular beam deflectors
Shang, X.; Joshi, P.; Tan, J.; De Smet, J.; Cuypers, D.; Baghdasaryan, T.; Vervaeke, M.; Thienpont, H. and De Smet, H. 
Journal of Physics D: Applied Physics 49, p. 165101

Tunable optical beam deflection via liquid crystal gradient refractive index generated by highly resistive polymer film
Shang, X.; Trinidad, A.; Joshi, P.; De Smet, J.; Cuypers, D. and De Smet, H.
IEEE Photonics Journal 8 (3), p. 1 - 11

67 GHz uni-traveling carrier photodetector on an InP-membrane-on-silicon platform
Shen, L.; Jiao, W.; Cao, Z.; van der Tol, J.; Roelkens, G. and Smit, M.
Conference on Lasers and Electro-Optics - CLEO, STh1G.5

Double-sided processing for membrane-based photonic integration
Shen, L.; Jiao, Y.; Higuera-Rodriguez, A.; Millan-Mejia, A.; Roelkens, G.; Smit, M. and van de Tol, J.
18th European Conference in Integrated Optics - ECIO, p. ECIO/o-31

High-bandwidth uni-traveling carrier waveguide photodetector on an InP-membrane-on-silicon platform
Shen, L.; Jiao, Y.; Yao, W.; Cao, Z.; van Engelen, J.; Roelkens, G.; Smit, M. and van der Tol, J.
Optics Express 24 (8), p. 8290 - 8301

Low optical loss-n-type ohmic contacts for InP-based membrane devices
Shen, L.; van Veldhoven, P.; Jiao, Y.; Dolores Calzadilla, V.; van der Tol, J.; Roelkens, G. and Smit, M.
Proceedings of the 20th Annual Symposium of the IEEE Photonics Society Benelux Chapter, p. 47 - 50

Ohmic contacts with ultra-low optical loss on heavily doped n-type InGaAs and InGaAsP for InP-based photonic membranes
Shen, L.; van Veldhoven, P.; Jiao, Y.; Dolores-Calzadilla, V.; van de Tol, J.; Roelkens, G. and Smit, M.
IEEE Photonics Journal 8 (1), p. 4500210

Adiabatically bent waveguides on silicon nitride photonics for compact and dense footprints Song, J.; Kongnyuy, T.; Stassen, A.; Mukund, V. and Rottenberg, X. 
IEEE Photonics Technology Letters 28 (20), p. 2164 - 2167

Integrated optical frequency shifter on a silicon platform
Spuesens, T.; Li, Y.; Verheyen, P.; Lepage, G.; Balakrishnan, S.; Absil, P. and Baets, R.
CLEO: Science and Innovations 2016, p. SF2G.1

Grating couplers with an integrated power splitter for high-intensity optical power distribution
Spuesens, T.; Pathak, S.; Vanslembrouck, M.; Dumon, P. and Bogaerts, W.
IEEE Photonics Technology Letters 28 (11), p. 1173 - 1176

Silicon socket layer for highly tunable phonon-phonon coupling in integrated circuits
Tiebot, P.; Van Laer, R.; Kuyken, B. and Van Thourhout, D.
Conference on Lasers and Electro-Optics - CLEO, jTh2A.115

Narrow line width frequency comb source based on an injection-locked III-V-on-silicon mode-locked laser
Uvin, S.; Keyvaninia, S.; Lelarge, F.; Duan, G.; Kuyken, B. and Roelkens, G.
Optics Express 24 (5), p. 5277 - 5288

Narrow line width injection-locked III-V-on-silicon mode-locked laser
Uvin, S.; Keyvaninia, S.; Lelarge, F.; Duan, G.; Kuyken, B. and Roelkens, G.
18th European Conference in Integrated Optics - ECIO, p. ECIO/o-12

A novel optically wide-band electro-absorption modulator based on bandfilling in n-InGaAs
Van Engelen, J.; Shen, L.; Van der Tol, J.; Roelkens, G. and Smit, M. 
18th European Conference in Integrated Optics - ECIO, p. ECIO/p-32

Patterning of graphene on silicon-on-insulator waveguides through laser ablation and plasma etching
Van Erps, J.; Ciuk, T.; Pasternak, I.; Krajewska, A.; Strupinski, W.; Van Put, S.; Van Steenberge, G.; Baert, K.; Terryn, H.; Thienpont, H. and Vermeulen, N.
Silicon Photonics and Photonic Integrated Circuits V, p. 98910T

Unifying brillouin scattering and cavity optomechanics
Van Laer, R.; Baets, R. and Van Thourhout, D.
Physical Review A 93, p. 53828

Photothermal mid-infrared spectroscopy using fano resonances in silicon microring resonators
Vasiliev, A.; Malik, A.; Muneeb, M.; Baets, R. and Roelkens, G. 
Conference on Lasers and Electro-Optics - CLEO, SF2H.5

3.8 µm heterogeneously integrated III-V on silicon micro-spectrometer
Vasiliev, A.; Muneeb, M.; Ruocco, A.; Malik, A.; Chen, H.; Nedeljkovic, M.; Soler-Penades, J.; Cerutti, L.; Rodriguez, J.; Mashanovich, G.; Smit, M.; Tournie, E. and Roelkens, G.
18th European Conference in Integrated Optics - ECIO, p. ECIO/p-24

A 40 Gbaud integration silicon coherent receiver
Verbist, J.; Zhang, J.; Moeneclaey, B.; Soenen, W.; Van Weerdenburg, J.; Van Uden, R.; Okonkwo, C.; Yin, X.; Roelkens, G. and Bauwelinck, J.
18th European Conference in Integrated Optics - ECIO, p. ecio/021

Optimization of silicon photonic components using multi-fidelity simulations and co-kriging
Wahl, P.; Couckuyt, I.; Kremers, C.; Demming, F.; Dhaene, T. and Bogaerts, W.
24th International Workshop on Optical Wave & Waveguide Theory and Numerical Modelling - OWTNM, p. ECIO/O-46

SWIR InGaAs/GaAsSb type-II quantum well photodetectors and spectrometers integrated on SOI
Wang, R.; Muneeb, M.; Sprengel, S.; Boehm, G.; Baets, R.; Amann, M. and Roelkens, G.
Silicon Photonics XI, p. 975209

III-V-on-silicon 2-µm-wavelength-range wavelength demultiplexers with heterogeneously integrated InP-based type-II photodectectors
Wang, R.; Muneeb, M.; Sprengel, S.; Boehm, G.; Malik, A.; Baets, R.; Amann, M. and Roelkens, G.
Optics Express 24 (8), p. 8480 - 8490

Design and fabrication of type-II InP-based lasers and photodetectors integrarted on SOI waveguide
Wang, R.; Sprengel, S.; Muneeb, M.; Boehm, G.; Baets, R.; Amann, M. and Roelkens, G.
Proceedings of the 20th Annual Symposium of the IEEE Photonics Society Benelux Chapter, p. 7 - 10

Room temperature InGaAs/InP distributed feedback laser directly grown on silicon
Wang, Z.; Tian, B.; Pantouvaki, M.; Van Campenhout, J.; Merckling, C. and Van Thourhout, D.
Conference on Lasers and Electro-Optics - CLEO, SW4M.3

Brillouin resonance broadening due to structural variations in nanoscale waveguides
Wolff, C.; Van Laer, R.; Eggleton, B. and Poulton, C.
New Journal of Physics 18 (2), p. 25006


Integrated silicon nitride microdisk lasers based on quantum dots Xie, W.; Stoferle, T.; Raino, G.; Aubert, T.; Zhu, Y.; Mahrt, R.; Brainis, E.; Hens, Z. and Van Thourhout, D.
CLEO: Applications and Technology 2016, p. JTh4B.6

Backscatter model for nanoscale silicon waveguides
Xing, Y.; Li, A.; Van Laer, R.; Baets, R. and Bogaerts, W. 
24th International Workshop on Optical Wave & Waveguide Theory and Numerical Modelling - OWTNM , p. OWTNM/O-18

Stochastic collocation for device-level variability analysis in integrated photonics
Xing, Y.; Spina, D.; Li, A.; Dhaene, T. and Bogaerts, W.
Photonics Research 4 (4), p. 93 - 100

Compact low-power-consumption 28-Gbaud QPSK/16-QAM integrated silicon photonic/electronic coherent receiver
Zhang, J.; Verbist, J.; Moeneclaey, B.; van Weerdenburg, J.; van Uden, R.; Chen, H.; Van Campenhout, J.; Okwonko, C.; Yin, X.; Bauwelinck, J. and Roelkens, G.
IEEE Photonics Journal 8 (1), p. 7100110

Multiplex coherent anti-stokes raman spectroscopy on a CMOS compatible platform
Zhao, H.; Clemmen, S. and Baets, R.
Proceedings of the 20th Annual Symposium of the IEEE Photonics Society Benelux Chapter, p. 181 - 184

Fabrication of optomicrofluidics for real-time bioassays based on hollow sphere colloidal photonic crystals with wettability patterns Zhong, K.; Khorshid, M.; Li, J.; Markey, K.; Hermann Wagner, P.; Song, K.; Van Cleuvenbergen, S. and Clays,K.
Journal of Materials Chemistry C 4 (16), p. 7853 - 7858

Ultra-compact silicon nitride grating coupler for microscopy system
Zhu, Y.; jiao, Y.; Wang, J.; Xie, W.; Bin, T. and Van Thourhout, D.
Proceedings of the 20th Annual Symposium of the IEEE Photonics Society Benelux Chapter, p. 55 - 58

Electronics for healthcare and life sciences

Thermal and quantum depletion of superconductivity in narrow junctions created by controlled electromigration
Baumans, X.; Cerbu, D.; Adami, O.; Zharinov, V.; Verellen, N.; Papari, G.; Scheerder, J.; Zhang, G.; Moshchalkov, V.; Silhanek, A. and Van de Vondel, J.
Nature Communications 7, p. 10560

Biocompatible label-free detection of carbon black particles by femtosecond pulsed laser microscopy
Bové, H.; Steuwe, C.; Fron, E.; Slenders, E.; D'Haen, J.; Fujita, Y.; Uji-i, H.; vandeVen, M.; Roeffaers, M. and Ameloot, M.
Nano Letters 16 (5), p. 3173 - 3178

Robust wireless capacitive ECG system with adaptive signal quality and motion artifact reduction
Castro Miller, I.; Morariu, R.; Torfs, T.; Van Hoof, C. and Puers, B. 
IEEE International Symposium on Medical Measurements and Applications - MeMeA, p. 585 - 590

RTM production monitoring of the A380 hinge arm droop nose mechanism: a multi-sensor approach
Chiesura, G.; Lamberti, A.; Yang, Y.; Luyckx, G.; Van Paepegem, W.; Vanlanduit, S.; Vanfleteren, J. and Degrieck, J.
Sensors 16 (6), p. 866

The Birkhoff theorem for unitary matrices of prime dimension
De Vos, A. and De Baerdemacker, S.
Linear Algebra and its Applications 493, p. 455 - 468

The bacterial cell cycle checkpoint protein Obg and its role in programmed cell death
Dewachter, L.; Verstraeten, N.; Fauvart, M. and Michiels, J.
Microbial Cell 3 (6), p. 255 - 256

Lab-on-a-chip raman sensors outperforming raman microscopes
Dhakal, A.; Raza, A.; Wuytens, P.; Peyskens, F.; Skirtach, A.; Le Thomas, N. and Baets, R.
CLEO 2016 , p. SM2O.3

Development of nanostars as a biocompatible tumor contrast agent: toward in vivo SERS imaging
D'Hollander, A.; Mathieu, E.; Jans, H.; Vande Velde, G.; Stakenborg, T.; Van Dorpe, P.; Himmelreich, U. and Lagae, L.
International Journal of Nanomedicine 11, p. 3703 - 3714

Comparison of epoxy- and siloxane-based single-mode optical waveguides defined by direct-write lithography
Elmogi Mosad, A.; Bosman, E.; Missinne, J. and Van Steenberge, G.
Optical Materials 52, p. 26 - 31

Elucidation of the mode of action of a new antibacterial compound active against Staphylococcus aureus and Pseudomonas aeruginosa Gerits, E.; Blommaert, E.; Lippell, A.; O'Neill, A.; Weytjens, B.; De Mayer, D.; Fierro, A.; Marchal, K.; Marchand, A.; Chaltin, P.; Spincemaille, P.; De Brucker, K.; Thevissen, K.; Cammue, B.; Swings, T.; Liebens, V.; Fauvart, M.; Verstraeten, N. and Michiels,J.
PLoS ONE 11 (5), p. e0155139

On-chip fluorescence excitation and collection by focusing grating couplers
Kerman, S.; Vercruysse, D.; Claes, T.; Mahmud Ul Hasan, H.; Neutens, P.; Mukund, V.; Rottenberg, X.; Lagae, L. and Van Dorpe,P.
Silicon Photonics and Photonic Integrated Circuits V, p. 98911L

Bone biosensors: knowing the present and predicting the future
Khashayar, P.; Amoabediny, G.; Larijani, B. and Vanfleteren, J.
Journal of Micromechanics and Microengineering 26 (2), p. 23002

A battery-powered efficient multi-sensor acquisition system with simultaneous ECG, BIO-Z, GSR, and PPG
Konijnenburg, M.; Stanzione, S.; Yan, L.; Jee, D.; Pettine, J.; Van Wegberg, R.; Kim, H.; van Liempd, C.; Fish, R.; Schuessler, J.; de Groot, H.; Van Hoof, C.; Yazicioglu, R. and Van Helleputte, N.
IEEE International Solid-State Circuits Conference - ISSCC, p. 480 - 481

Multiplexed site-specific electrode functionalization for multitarget biosensors
Levrie, K.; Jans, K.; Vos, R.; Ardakanian, N.; Verellen, N.; Van Hoof, C.; Lagae, L. and Stakenborg, T.
Bioelectrochemistry 112, p. 61 - 66

All-dielectric nano-antennas for wavelength-controlled bidirectional scattering of visible light
Li, J.; Verellen, N.; Boeckx, S.; Vercruysse, D.; Willems, K.; Neutens, P.; Bearda, T.; Chen, C.; Lagae, L. and Van Dorpe,P.
Nanophotonics VI, p. 98840W

All-dielectric antenna wavelength router with bidirectional scattering of visible light
Li, J.; Verellen, N.; Vercruysse, D.; Bearda, T.; Lagae, L. and Van Dorpe,P.
Nano Letters 16 (7), p. 4396 - 4403

Asymmetric plasmonic induced ionic noise in metallic nanopores
Li, Y.; Chen, C.; Willems, K.; Lagae, L.; Groeseneken, G.; Stakenborg, T. and Van Dorpe, P.
Nanoscale 8 (24), p. 12324 - 12329

A whole-cell-based high-throughput screening method to identify molecules targeting pseudomonas aeruginosa persister cells
Liebens, V.; Defraine, V. and Fauvart, M.
Bacterial Persistence, p. 113 - 120

Detection of lung cancer through metabolic changes measured in blood plasma
Louis, E.; Adriaensens, P.; Guedens, W.; Bigirumurame, T.; Baeten, K.; Vanhove, K.; Vandeurzen, K.; Darquennes, K.; Vansteenkiste, J.; Dooms, C.; Shkedy, Z.; Mesotten, L. and Thomeer, M.
Journal of thoracic oncology 11 (4), p. 516 - 523

Fluorescence excitation and detection on a chip using nanophotonic waveguides
Mahmud Ul Hasan, H.; Neutens, P.; Lagae, L. and Van Dorpe, P.
Nanophotonics VI, p. 988405

Time-lapse lens-free imaging of cell migration in diverse physical microenvironments
Mathieu, E.; Paul, C.; Stahl, R.; Vanmeerbeeck, G.; Reumers, V.; Liu, C.; Konstantopoulos, K. and Lagae, L.
Lab on a Chip 16 (17), p. 3304 - 3316

Bacterial Persistence (Series: Methods in Molecular Biology, Vol. 1333; Springer)
Michiels, J. and Fauvart, M.

0.6V 0.015mm2 time-based biomedical readout for ambulatory applications in 40nm CMOS Mohan, R.; Zaliasl, S.; Van Hoof, C.; Van Helleputte, N. and Yazicioglu, R. 
IEEE International Solid-State Circuits Conference - ISSCC, p. 482 - 483

A 966-Electrode Neural Probe with 384 Configurable Channels in 0.13µm SOI CMOS
Mora Lopez, C.; Mitra, S.; Putzeys, J.; Raducanu, B.; Ballini, M.; Andrei, A.; Severi, S.; Welkenhuysen, M.; Van Hoof, C. and Yazicioglu, F.
IEEE International Solid-State Circuits Conference - ISSCC, p. 392 - 393

A new hand gesture recognition approach for robotic assistants based on mobile devices
Ochoa-Zambrano, J.; Robles-Bykbaev, V.; Flores-Tapia, T. and Doutreloigne, J.
International Journal of Electronics and Electrical Engineering 4 (1), p. 96 - 99

A 172$lW compressive sampling photoplethysmographic readout with embedded direct heart-rate and variability extraction from compressively sampled data
Pamula, V.; Valero Sarmiento, J.; Yan, L.; Bozkurt, A.; Van Hoof, C.; Van Helleputte, N.; Yazicioglu, R. and Verhelst, M.
IEEE International Solid State Circuits Conference - ISSCC, p. 386 - 387

Imaging of transfection and intracellular release of intact, non-labeled DNA using fluorescent nanodiamonds
Petrakova, V.; Benson, V.; Buncek, M.; Fiserova, A.; Ledvina, M.; Stursa, J.; Cigler, P. and Nesladek, M.
Nanoscale 8 (23), p. 12002 - 12012

DNA detection with top-down fabricated silicon nanowire transistor arrays in linear operation regime
Schwartz, M.; Nguyen, T.; Vu, X.; Weil, M.; Wilhelm, J.; Wagner, P.; Thoelen, R. and Ingebrandt, S.
Physica Status Solidi A 213 (6), p. 1510 - 1519

Highly sensitive waveguide bragg grating temperature sensor using hybrid polymers
Teigell Beneitez, N.; Missinne, J.; Shi, Y.; Chiesura, G.; Luyckx, G.; Degrieck, J. and Van Steenberge, G.
IEEE Photonics Technology Letters 28 (10), p. 1150 - 1153

Evanescent field biosensor using polymer slab waveguide-based cartridges for the optical detection of nanoparticles
Teigell Beneitez, N.; Missinne, J.; Visser, E.; van Ijzendoorn, L.; Prins, M.; Schleipen, J.; Vinkenborg, J.; Rietjens, G.; Verschuuren, M.; Krishnamoorthy, G.; Orsel, J. and Van Steenberge, G.
IEEE Journal of Selected Topics in Quantum Electronics 22 (3), p. 6900108

An integrated one-chip-sensor system for microRNA quantitative analysis based on digital droplet polymerase chain reaction
Tsukuda, M.; Wiederkehr, R.; Cai, Q.; Majeed, B.; Fiorini, P.; Stakenborg, T. and Toshinobo, M.
Japanese Journal of Applied Physics 55 (4s), p. 04EM05

Polydopamine-gelatin as universal cell-interactive coating for methacrylate-based medical device packaging materials: when surface chemistry overrules substrate bulk properties
Van De Walle, E.; Van Nieuwenhove, I.; Vanderleyden, E.; Declercq, H.; Gellynck, K.; Schaubroeck, D.; Ottevaere, H.; Thienpont, H.; De Vos, W.; Cornelissen, M.; Van Vlierberghe, S. and Dubruel, P.
Biomacromolecules 17, p. 56 - 68

Should we develop screens for multi-drug antibiotic tolerance?
Van den Bergh, B.; Michiels, J.; Fauvart, M. and Michiels, J.
Expert Review of Anti-infective Therapy 14 (7), p. 613 - 616

Frequency of antibiotic application drives rapid evolutionary adaptation of Escherichia coli persistence
Van den Bergh, B.; Michiels, J.; Wenseleers, T.; Windels, E.; Vanden Boer, P.; Kestemont, D.; De Meester, L.; Verstrepen, K.; Verstraeten, N.; Fauvart, M. and Michiels, J.
Nature Microbiology 1 (4), p. 16020

Density controlled nanophotonic waveguide gratings for efficient on-chip out-coupling in the near field
Vercruysse, D.; Mukund, V.; Jansen, R.; Stahl, R.; Van Dorpe, P.; Lagae, L. and Rottenberg, X.
Silicon Photonics and Photonic Integrated Circuits V, p. 98910A

Designing complex radiative behaviour of metallic nanoantennas Verellen, N.; Vercruysse, D.; Zheng, X.; Boeckx, S.; Li, J.; Vandenbosch, G.; Lagae, L. and Van Dorpe, P. 
Nanophotonics VI, p. 98841O

A historical perspective on bacterial persistence
Verstraeten, N.; Knapen, W.; Fauvart, M. and Michiels, J.  
Bacterial Persistence, p. 3 - 13

An integrated multi-electrode-optrode array for in vitro optogenetics
Welkenhuysen, M.; Hoffman, L.; LUO, Z.; De Proft, A.; Van Den Haute, C.; Baekelandt, V.; Debyser, Z.; Gielen, G.; Puers, B. and Braeken, D.
Scientific Reports (6), p. 20353  

Direct fabrication of monodisperse silica nanorings from hollow spheres – a template for core-shell nanorings
Zhong, K.; Li, J.; Liu, L.; Brullot, W.; Bloemen, M.; Volodin, A.; Song, K.; Van Dorpe, P.; Verellen, N. and Clays, K.
ACS Applied Materials & Interfaces 8 (16), p. 10451 - 10458

Wireless communication

An energy-efficient reconfigurable ASIP supporting multi-mode MIMO detection
Ahmad, U.; Li, M.; Amin, A.; LI, M.; Van der Perre, L.; Lauwereins, R. and Pollin, S.
Journal of Signal Processing Systems 85 (1), p. 5 - 21

PMCW waveform and MIMO technique for a 79 GHz CMOS automotive radar
Bourdoux, A.; Ahmad, U.; Guermandi, D.; Brebels, S.; Dewilde, A. and Van Thillo, W.
IEEE Radar Conference, p. 1 - 5

60-GHz CMOS TX/RX chipset on organic packages with integrated phased-array antennas
Brebels, S.; Khalaf, K.; Mangraviti, G.; Vaesen, K.; Libois, M.; Parvais, B.; Vidojkovic, V.; Szortyka, V.; Bourdoux, A.; Wambacq, P.; Soens, C. and Van Thillo, W.
10th European Conferenece on Antennas and Propagation - EuCAP

Wavelength-mulitplexed duplex tranceiver based on III-V/Si hybrid integration for off-chip and on-chip optical interconnects
Chen, K.; Huang, Q.; Zhang, J.; Cheng, J.; Xin, F.; Zhang, C.; Ma, K.; Shi, Y.; Van Thourhout, D.; Roelkens, G.; Liu, L. and He, S.
IEEE Photonics Journal 8 (1), p. 7900910

Hierarchy and the nature of information
Cottam, R.; Ranson, W. and Vounckx, R.
Information 7 (1) Article 1

Signal, noise and interference power analysis in MRT-based Massive MIMO systems
Desset, C.
IEEE International Symposium on Circuits and Systems - ISCAS, p. 546 - 549

A dual-frequency 0.7-to-16GHz balance network for electrical balance duplexers
Hershberg, B.; van Liempd, B.; Zhang, X.; Wambacq, P. and Craninckx, J.
IEEE International Solid-State Circuits Conference - ISSCC, p. 356 - 357

Lectin-glycan interaction network-based identification of host receptors of microbial pathogenic adhesins
Ielasi, F.; Alioscha-Perez, M.; Donohue, D.; Claes, S.; Sahli, H.; Schols, D. and Willaert, R.
mBio 7 (4), p. e00584-16

Digitally-modulated CMOS polar transmitters for highly-rfficient mm-wave wireless communication
Khalaf, K.; Vidojkovic, V.; Vaesen, K.; Libois, M.; Mangraviti, G.; Szortyka, V.; Li, C.; Verbruggen, B.; Ingels, M.; Bourdoux, A.; Soens, C.; Van Thillo, W.; Long, J. and Wambacq, P.
IEEE Journal of Solid-State Circuits 51 (7), p. 1579 - 1592

Threefold rotationally symmetric SIW antenna array for ultra-short-range MIMO communication
Lemey, S.; Castel, T.; Van Torre, P.; Vervust, T.; Vanfleteren, J.; Demeester, P.; Vande Ginste, D. and Rogier, H.
IEEE Transactions on Antennas and Propagation 64 (5), p. 1689 - 1699

A 150kHz-80MHz BW discrete-time analog baseband for aoftware-defined-radio receivers using a 5th-order IIR LPF, active FIR and a 10 bit 300 MS/s ADC in 28nm CMOS
Malki, B.; Verbruggen, B.; Martens, E.; Wambacq, P. and Craninckx, J.
IEEE Journal of Solid-State Circuits 51 (7), p. 1593 - 1606

A 4-Antenna-Path Beamforming Transceiver for 60GHz Multi-Gb/s Communication in 28nm CMOS
Mangraviti, G.; Khalaf, K.; Shi, Q.; Vaesen, K.; Guermandi, D.; Giannini, V.; Brebels, S.; Frazzica, F.; Bourdoux, A.; Soens, C.; Van Thillo, W. and Wambacq, P.
International Solid-State Circuits Conference (ISSCC), p. 246 - 247

Characterization of a novel microwave heater for continuous flow microfluidics fabricated on high-resistivity silicon
Markovic, T.; Ocket, I.; Jones, B. and Nauwelaers, B.
IEEE MTT-S International Microwave Symposium - IMS p. 1 - 4

A self-calibrated 10 Mb/s phase modulator with -37.4 dB EVM based on a 10.1-12.4 GHz, -246.6 dB FoM fractional-N subsampling PLL
Markulic, N.; Raczkowski, K.; Martens, E.; Paro Filho, P.; Hershberg, B.; Wambacq, P. and Craninckx, J.
IEEE International Solid-State Circuits Conference - ISSCC, p. 176 - 177

Millimeter wave cavity backed aperture coupled microstrip patch antenna
Mosalanejad, M.; Brebels, S.; Ocket, I.; Soens, C.; Vandenbosch, G. and Bourdoux, A.
10th European Conference on Antennas and Propagation - EuCAP, p. 1 - 5

Range and coexistence analysis of long range unlicensed communication
Reynders, B.; Meert, W. and Pollin, S.
23rd International Conference on Telecommunications - ICT, p. 1 - 6

Understanding interdependency through complex information sharing
Rosas, F.; Ntranos, V.; Ellison, C.; Pollin, S. and Verhelst, M.
Entropy 18 (2), p. 38

Optimizing the code rate of energy-constrained wireless communications with HARQ
Rosas, F.; Souza, R.; Pellenz, M.; Oberli, C.; Brante, G.; Verhelst, M. and Pollin, S.
IEEE Transactions on Wireless Communications 15 (1), p. 191 - 205

Comparison of spatial and aspatial logistic regression models for landmine risk mapping
Schultz, C.; Alegría, A.; Cornelis, J. and Sahli, H. 
Applied Geography 66, p. 52 - 63

LTE in the sky: trading off propagation benefits with interference costs for aerial nodes
Van den Bergh, B.; Chiumento, A. and Pollin, S.
IEEE Communications Magazine 54 (5), p. 44 - 50

Performance analysis of in-band full duplex collision and interference detection in dense networks
Vermeulen, T.; Rosas, F.; Verhelst, M. and Pollin, S.
13th IEEE Annual Consumer Communications & Networking Conference (CCNC). Consumer Communications & Networking Conference, p. 595 - 601

Image sensors and vision systems

Characterization of VNIR hyperspectral sensors with monolithically integrated optical filters
Agrawal, P.; Tack, K.; Geelen, B.; Masschelein, B.; Aranda Moran, P.; Lambrechts, A. and Jayapala, M.
IS&T International Symposium on Electronic Imaging, Image Sensors and Imaging Systems, p. IMSE-280

A robust actin filaments image analysis framework
Alioscha-Perez, M.; Bendiba, C.; Goossens, K.; Kasas, S.; Dietle, G.; Willaert, R. and Sahli, H.
PLoS Computational Biology 12 (8), p. e1005063

Tracking with dynamic weighted compressive model
Chen, T.; Zhang, Y.; Yang, T. and Sahli, H.
Journal of Visual Communication and Image Representation 39, p. 253 - 265

Non-negative matrix completion for the enhancement of snapshot mosaic multispectral imagery
Tsagkatakis, G.; Jayapala, M.; Geelen, B. and Tsakalides, P.
IS&T International Symposium on Electronic Imaging, Image Sensors and Imaging Systems

Flexible electronics

Conduction mechanism in amorphous InGaZnO thin film transistors
Bhoolokam, A.; Nag, M.; Steudel, S.; Genoe, J.; Gelinck, G.; Kadashchuk, A.; Groeseneken, G. and Heremans, P.
Japanese Journal of Applied Physics 55 (1), p. 14301

Insights into the nanoscale lateral and vertical phase separation in organic bulk heterojunctions via scanning probe microscopy
Chintala, R.; Tait, J.; Eyben, P.; Voroshazi, E.; Surana, S.; Fleischmann, C.; Conard, T. and Vandervorst, W.
Nanoscale 8 (6), p. 3629 - 3637

Arrays of pentacene single crystals by stencil evaporation
Fesenko, P.; Flauraud, V.; Xie, S.; Brugger, J.; Genoe, J.; Heremans, P. and Rolin, C.
Crystal Growth and Design 16 (8), p. 4694 - 4700

Determination of crystal orientation in organic thin films using optical microscopy
Fesenko, P.; Rolin, C.; Janneck, R.; Bommanaboyena, S.; Gaethje, H.; Heremans, P. and Genoe, J.
Organic Electronics 37, p. 100 - 107

Interplay between hopping and band transport in high-mobility disordered semiconductors at large carrier concentrations: The case of the amorphous oxide InGaZnO
Fishchuk, I.; Kadashchuk, A.; Bhoolokam, A.; de Jamblinne de Meux, A.; Pourtois, G.; Gavrilyuk, M.; Köhler, A.; Bässler, H.; Genoe, J. and Heremans, P.
Physical Review B 93 (19), p. 195204

X-ray detector-on-plastic with high sensitivity using low cost, solution-processed organic photodiodes
Gelinck, G.; Kumar, A.; Moet, D.; van der Steen, J.; van Breemen, A.; Shanmugam, S.; Langen, A.; Gilot, J.; Groen, P.; Andriessen, R.; Simon, M.; Ruetten, W.; Douglas, A.; Raaijmakers, R.; Malinowski, P. and Myny,K.
IEEE Transactions on Electron Devices 63 (1), p. 197 - 204       

Mechanical and electronic properties of thin-film transistors on plastic, and their integration in flexible electronic applications
Heremans, P.; Tripathi, A.; de Jamblinne de Meux, A.; Smits, E.; Hou, B.; Pourtois, G. and Gelinck, G.
Advanced Materials 28 (22), p. 4266 - 4282

Real-time tracking of singlet exciton diffusion in organic semiconductors Kozlov, O.; de Haan, F.; Kerner, R.; Rand, B.; Cheyns, D. and Pshenichnikov, M.
Physical Review Letters 116, p. 57402

Multicolor 1250 ppi OLED arrays patterned by photolithography
Malinowski, P.; Ke, T.; Nakamura, A.; Vicca, P.; Wuyts, M.; Gu, D.; Steudel, S.; Janssen, D.; Kamochi, Y.; Koyama, I.; Iwai, Y. and Heremans, P.
SID Symposium Digest of technical Papers, p. 1009 - 1012

Surface analysis of the selective excimer laser patterning of a thin PEDOT:PSS film on flexible polymer films
Schaubroeck, D.; De Smet, J.; Willems, W.; Cools, P.; De Geyter, N.; Morent, R.; De Smet, H. and Van Steenberge, G.
Applied Surface Science 376 (15), p. 151 - 160

Smart liquid crystal beam deflector with laser ablated polymer micro grating structure
Shang, X.; Desmet, A.; Joshi, P.; De Smet, J.; Cuypers, D. and De Smet, H.
SID Symposium Digest of Technical Papers, p. 931 - 933

On the extraction of charge carrier mobility in high-mobility organic transistors
Uemura, T.; Rolin, C.; Ke, T.; Fesenko, P.; Genoe, J.; Heremans, P. and Takeya, J. 
Advanced Materials 28 (1), p. 151 - 155

Stretchable passive matrix LED display with thin-film based interconnects
Verplancke, R.; Cauwe, M.; Van Put, S.; Smits, E.; Kusters, R.; van Heck, G.; van den Brand, J.; Murata, M.; Ohmae, H.; Tomita, Y.; Nakata, H.; Vanfleteren, J. and De Smet, H.
SID Symposium Digest of Technical Papers, p. 664 - 667

Design and fabrication of a flexible dielectric sensor system for in situ and real-time production monitoring of glass fibre reinforced composites
Yang, Y.; Chiesura, G.; Vervust, T.; Bossuyt, F.; Luyckx, G.; Degrieck, J. and Vanfleteren, J.
Sensors and Actuators A: Physical 243, p. 103 - 110

Facile fabrication of stretchable Ag nanowire/polyurethane electrodes using high intensity pulsed light
Yang, Y.; Ding, S.; Araki, T.; Jiu, J.; Sugahara, T.; Wang, J.; Vanfleteren, J.; Sekitani, T. and Suganuma, K.
Nano Research 9 (2), p. 401 - 414

Energy

Toxicity of organometal halide perovskite solar cells
Babayigit, A.; Ethirajan, A.; Muller, M. and Conings, B.
Nature Materials 15, p. 247 - 251

Oxygen-induced degradation in C60-based organic solar cells: Relation between film properties and devicce performance
Bastos, J.; Voroshazi, E.; Fron, E.; Brammertz, G.; Vangerven, T.; Van der Auweraer, M.; Poortmans, J. and Cheyns, D.
ACS Applied Materials & Interfaces 8 (15), p. 9798 - 9805

NMOS-based integrated modular bypass for use in solar systems (NIMBUS): Intelligent bypass for reducing partial shading power loss in solar panel applications
Bauwens, P. and Doutreloigne, J.
Energies 9 (6), p. 450

Reconfigurable topologies for smarter PV modules: simulation, evaluation and implementation
Bauwens, P.; Govaerts, J.; Baka, M.; Catthoor, F.; Baert, K.; Vandenbroeck, G.; Goverde, H.; Anagnostos, D.; Doutreloigne, J. and Poortmans, J.
32nd European Photovoltaic Solar Energy Conference - EPVSEC p. 61 - 65

Ultrathin PECVD epitaxial Si solar cells on glass via low-temperature transfer process
Cariou, R.; Chen, W.; Cosme-Bolanos, I.; Maurice, J.; Foldyna, M.; Depauw, V.; Patriarche, G.; Gaucher, A.; Cattoni, A.; Massiot, I.; Collin, S.; Cadel, E.; Pareige, P. and Roca i Cabarrocas, P.
Progress in Photovoltaics Research and Applications 24 (8), p. 1075 - 1084

Nanophotonics-based low temperature PECVD epitaxial crystalline silicon solar cells
Chen, W.; Cariou, R.; Foldyna, M.; Depauw, V.; Trompoukis, C.; Drouard, E.; Lalouat, L.; Harouri, A.; Liu, J.; Fave, A.; Orobtchouk, R.; Mandorlo, F.; Seassal, C.; Massiot, I.; Dmitriev, A.; Lee, K. and Roca i Cabarrocas, P.
Journal of Physics D: Applied Physics 49 (12), p. 125603

Influence of anodic bonding on the surface passivation quality of crystalline silicon
Chen, W.; Depauw, V.; Haddad, F.; Maurice, J. and Roca i Cabarrocas, P.
Solar Energy Materials and Solar Cells 157, p. 154 - 160

Bifacial n-PERT cells (Bi-PERT) with plated contacts for multi-wire interconnection
Cornagliotti, E.; Russell, R.; Tous, L.; Uruena De Castro, A.; Duerinckx, F.; Aleman, M.; Choulat, P.; Sharma, A.; John, J. and Szlufcik, J.
32nd European Photovoltaic Solar Energy Conference - EPVSEC, p. 2CO.2.5

Non-hazardous solvent systems for processing perovskite photovoltaics
Gardner, K.; Tait, J.; Merckx, T.; Qiu, W.; Paetzold, U.; Kootstra, L.; Jaysankar, M.; Gehlhaar, R.; Cheyns, D.; Heremans, P. and Poortmans, J.
Advanced Energy Materials 6 (14), p. doi: 10.1002/aen

Innovative approaches to interconnect back-contact cells
Govaerts, J.; Borgers, T.; Voroshazi, E.; Jambaldinni, S.; O'Sullivan, B.; Singh, S.; Debucquoy, M.; Szlufcik, J. and Poortmans, J.
32nd European Photovoltaic Solar Energy Conference - EUPVSEC,p. 1AP.1.2

Impact of wind on intra-module energy yield variations
Goverde, H.; Van den Broeck, G.; Anagnostos, D.; Herteleer, B.; Govaerts, J.; Goossens, D.; Voroshazi, E.; Baert, K.; Catthoor, F.; Driesen, J. and Poortmans, J.
32nd European Photovoltaic Solar Energy Conference - EUPVSC, p. 5CO.16.2

Multiple reuse of the silicon substrate in a porous silicon based layer transfer process
Hajijafarassar, A.; Van Nieuwenhuysen, K.; Sharlandziev, I.; Depauw, V.; Sivaramakrishnan Radhakrishnan, H.; Bearda, T.; Debucquoy, M.; Gordon, I.; Szlufcik, J.; Abdulraheem, Y.; Poortmans, J. and Magagnin, L.
32nd European Photovoltaic Solar Energy Conference - EPVSEC, p. 2BO.2.6

The effect of surface morphology on the performance of 21% n-type PERT solar cells with an epitaxial rear emitter
Hajjiah, A.; Duerinckx, F.; Recaman Payo, M.; Kuzma Filipek, I. and Poortmans, J.
Solar Energy Materials and Solar Cells 151, p. 139 - 148

Towards a solution deposited 3D thin-film Li-ion battery
Hardy, A.; Gielis, S.; Maino, G.; Van den Ham, J. and Van Bael, M.
40th International Conference and Expo on Advanced Ceramics and Composites - ICACC

Performance optimization of Au-free lateral AlGaN/GaN schottky barrier diode with gated edge termination on 200-mm silicon substrate
Hu, J.; Stoffels, S.; Lenci, S.; Bakeroot, B.; De Jaeger, B.; Van Hove, M.; Liang, H.; Zhao, M.; Groeseneken, G. and Decoutere, S.
IEEE Transactions on Electron Devices 63 (3), p. 997 - 1004

Statistical analysis of the impact of anode recess on the electrical characteristics of AlGaN/GaN Schottky diodes with gated edge termination
Hu, J.; Stoffels, S.; Lenci, S.; De Jaeger, B.; Ronchi, N.; Tallarico, A.; Wellekens, D.; You, S.; Bakeroot, B.; Groeseneken, G. and Decoutere, S.
IEEE Transactions on Electron Devices 63 (9), p. 3451 - 3458

On the identification of buffer trapping for bias-dependent RON instability of AlGaN/GaN schottky barrier diode with AlGaN:C back barrier
Hu, J.; Stoffels, S.; Lenci, S.; Groeseneken, G. and Decoutere, S.
IEEE Electron Device Letters 37 (3), p. 310 - 313

Impact of AlGaN barrier recess on the DC and dynamic characteristics of AlGaN/GaN Schottky barrier diodes with gated edge termination
Hu, J.; Stoffels, S.; Lenci, S.; Ronchi, N.; De Jaeger, B.; You, S.; Bakeroot, B.; Groeseneken, G. and Decoutere, S.
Compound Semiconductor Week - CSW, p. 1

Leakage and trapping characteristics in Au-free AlGaN/GaN Schottky barrier diodes fabricated on C-doped buffer layers
Hu, J.; Stoffels, S.; Lenci, S.; You, S.; Bakeroot, B.; Ronchi, N.; Groeseneken, G. and Decoutere, S.
Physica Status Solidi A 213 (5), p. 1229 - 1235

Dopant-free hole-transporting material with a C-3h symmetrical truxene core for highly efficient perovskite solar cells
Huang, C.; Fu, W.; Li, C.; Zhang, Z.; Qiu, W.; Shi, M.; Heremans, P.; Jen, A. and Chen, H.
Journal of the American Chemical Society 138 (8), p. 2528 - 2531

Device breakdown optimization of Al2O3/GaN E-mode MISFETs
Kang, X.; Wellekens, D.; Van Hove, M.; De Jaeger, B.; Ronchi, N.; Wu, T.; You, S.; Bakeroot, B.; Hu, J.; Marcon, D.; Stoffels, S. and Decoutere, S.
IEEE International Reliability Physics Symposium - IRPS, p. CD-5

High-permittivity conjugated polyelectrolyte interlayers for high-performance bulk heterojunction organic solar cells
Kesters, J.; Govaerts, S.; Pirotte, G.; Drijkoningen, J.; Chevrier, M.; Van den Brande, N.; Liu, X.; Fahlman, M.; Van Mele, B.; Lutsen, L.; Vanderzande, D.; Manca, J.; Clément, S.; Van Hauff, E. and Maes, W.
ACS Applied Materials & Interfaces 8 (10), p. 6309 - 6314

A direct arylation approach towards efficient small molecule organic solar cells
Kudrjasova, J.; Kesters, J.; Verstappen, P.; Brebels, J.; Vangerven, T.; Cardinaletti, I.; Drijkoningen, J.; Penxten, H.; Manca, J.; Lutsen, L.; Vanderzande, D. and Maes, W.
Journal of Materials Chemistry A 4 (3), p. 791 - 795

22.3 % nPERT cells on epitaxially grown silicon wafers
Kuzma Filipek, I.; Recaman Payo, M.; Duerinckx, F.; Hao, R.; Ravi, T.; Cornagliotti, E.; Choulat, P.; Sharma, A.; John, J.; Aleman, M.; Tous, L.; Russell, R.; Uruena De Castro, A.; Szlufcik, J. and Poortmans, J.
European Photovoltaic Solar Energy Conference - EUPVSEC, p. 2DO.16.1

AlGaN/GaN power Schottky diodes with anode dimension up to 100 mm on 200 mm Si substrate
Lenci, S.; Hu, J.; Ronchi, N. and Decoutere, S. 
28th International Symposium on Power Semiconductor Devices and ICs - ISPSD, p. 91 - 94

Selective epitaxial growth (SEG) of p-GaN gate layer for enhancement mode GaN/AlGaN HEMT
Liang, H.; Saripalli, Y.; De Jaeger, B. and Decoutere, S.
33rd International Conference on the Physics of Semiconductors - ICPS, p. Tu-P.011

Highly conformal fabrication of nanopatterns on non-planar surfaces
Massiot, I.; Trompoukis, C.; Lodewijks, K.; Depauw, V. and Dmitriev, A.
Nanoscale 8, p. 11461 - 11466

In-situ optical emission spectroscopy diagnostic of plasma ignition impact on crystalline silicon passivation by a-Si:H films
Meddeb, H.; Bearda, T.; Abdulraheem, Y.; Dimassi, W.; Ezzaouia, H.; Gordon, I.; Szlufcik, J. and Poortmans, J.
Superlattices and Microsctructures 96, p. 253 - 258

Trapping and reliability issues in GaN-based MIS HEMTs with partially recessed gate
Meneghesso, G.; Meneghini, M.; Bisi, D.; Rossetto, I.; Wu, T.; Van Hove, M.; Marcon, D.; Stoffels, S.; Decoutere, S. and Zanoni, E. 
Microelectronics Reliability 58 , p. 151 - 157

Negative bias-induced threshold voltage instability (NBTI) in GaN-on-Si power HEMTs
Meneghini, M.; Rossetto, I.; Bisi, D.; Ruzzarin, M.; Van Hove, M.; Stoffels, S.; Wu, T.; Marcon, D.; Decoutere, S.; Meneghesso, G. and Zanoni, E.
IEEE Electron Device Letters 37 (4), p. 474 - 476

Gate stability of GaN-based HEMTs with p-type gate
Meneghini, M.; Rossetto, I.; Rizzato, V.; Stoffels, S.; Van Hove, M.; Posthuma, N.; Wu, T.; Marcon, D.; Decoutere, S.; Meneghesso, G. and Zanoni, E.
Electronics 5 (2), p. 10.3390/electron

Loss analysis and design optimization of large-area high-efficiency back-contacted silicon solar cells
O'Sullivan, B.; Jambaldinni, S.; Singh, S.; Kyuzo, M.; Debucquoy, M. and Szlufcik, J.
IEEE Journal of Photovoltaics 6 (4), p. 810 - 816

Comparative indoor and outdoor degradation of organic photovoltaic cells via inter-laboratory collaboration
Owens, C.; Ferguson, G.; Hermenau, M.; Voroshazi, E.; Galagan, Y.; Zimmermann, B.; Rösch, R.; Angmo, D.; Teran-Escobar, G.; Uhrich, C.; Andriessen, R.; Hoppe, H.; Wurfel, U.; Lira-Cantu, M.; Krebs, F. and Tanenbaum, D.
Polymers 8 (1), p. doi:10.3390/poly

Analysis of point defect distributions in AlGaN/GaN heterostructures via spectroscopic photo current-voltage measurements
Ozden, B.; Khanal, M.; Youn, S.; Mirkhani, V.; Yapabandara, K.; Park, M.; Zhao, M.; Liang, H.; Kandaswamy, P. and Saripalli, Y.
ECS Journal of Solid State Science and Technology 5 (4), p. 3206 - 3210

Energy yield modelling of perovskite/silicon multijunction solar cells
Paetzold, U.; Gehlhaar, R.; Tait, J.; Debucquoy, M.; Jaysankar, M.; Aernouts, T. and Poortmans, J.
32nd European Photovoltaic Solar Energy Conference and Exhibition - EPVSEC, p. 3DV.2.1

Impact of Mg out-diffusion and activation on the p-GaN gate HEMT device performance
Posthuma, N.; You, S.; Liang, H.; Ronchi, N.; Kang, X.; Wellekens, D.; Saripalli, Y. and Decoutere, S.
28th IEEE International Symposium on Power Semiconductor Devices and ICs - ISPSD, p. 95 - 98

Electrical characterization of ultrathin RF-sputtered LiPON layers for nanoscale batteries
Put, B.; Vereecken, P.; Meersschaut, J.; Sepulveda Marquez, A. and Stesmans, A.
ACS Applied Materials & Interfaces 8 (11) , p. 7060 - 7069

Experimental benchmarking of electrical methods and $l-Raman spectroscopy for channel temperature detection in AlGaN/GaN HEMTs
Sodan, V.; Kosemura, D.; Stoffels, S.; Oprins, H.; Baelmans, M.; Decoutere, S. and De Wolf, I.
IEEE Transactions on Electron Devices 63 (6), p. 2321 - 2327

Chemical vapour deposition of zeolitic imidazolate framework thin films
Stassen, I.; Styles, M.; Grenci, G.; Van Gorp, H.; Vanderlinden, W.; De Feyter, S.; Falcaro, P.; De Vos, D.; Vereecken, P. and Ameloot, R.
Nature Materials 15 (3), p. 304 - 310

Improved efficiency of polymer-fullerene bulk heterojunction solar cells by the addition of CFu(II)-pophyrin-oligothiophene conjugates
Stoltzfus, D.; Kesters, J.; Kelchtermans, M.; Verstappen, P.; Cardinaletti, I.; Cornelissen, R.; D'Haen, J.; Lutsen, L.; Vanderzande, D.; Manca, J.; Bielawski, C.; Maes, W. and Sessler, J.
Synthetic Metals 218, p. 1 - 8

Electrical properties of patterned photoactive layers in organic
Tait, J.; La Notta, L.; Melkonyan, D.; Gehlhaar, R.; Cheyns, D.; Reale, A. and Heremans, P.
Solar Energy Materials and Solar Cells 144, p. 493 - 499

Rapid composition screening for perovskite photovoltaics via concurrently pumped ultrasonic spray coating
Tait, J.; Manghooli, S.; Qiu, W.; Rakocevic, L.; Kootstra, L.; Jaysankar, M.; Masse de la Huerta, C.; Paetzold, U.; Gehlhaar, R.; Cheyns, D.; Heremans, P. and Poortmans, J.
Journal of Materials Chemistry A 4 (10), p. 3792 - 3797

Interfacial Depletion Regions: Beyond the Space Charge Limit in Thick Organic Photovoltaics
Tait, J.; Paetzold, U.; Cheyns, D.; Turbiez, M.; Heremans, P. and Rand, B.
ACS Applied Materials & Interfaces

Understanding the degradation sources under ON-state stress in AlGaN/GaN-on-Si SBD: Investigation of the anode-cathode apacing length dependence
Tallarico, A.; Magnone, P.; Stoffels, S.; Lenci, S.; Hu, J.; Marcon, D.; Sangiorgi, E.; Decoutere, S. and Fiegna, C.
IEEE International Reliability Physics Symposium , p. 4A.5

Reliability of Au-free AlGaN/GaN-on-silicon Schottky barrier diodes under ON-state stress
Tallarico, A.; Stoffels, S.; Magnone, P.; Hu, J.; Lenci, S.; Marcon, D.; Sangiorgi, E.; Fiegna, C. and Decoutere, S.
IEEE Transactions on Electron Devices 63 (2), p. 723 - 730

Disordered nanostructures by hole-mask colloidal lithography for advanced light trapping in silicon solar cells
Trompoukis, C.; Massiot, I.; Depauw, V.; El Daif, O.; Lee, K.; Dmitriev, A.; Gordon, I.; Mertens, R. and Poortmans, J.
Optics Express 24 (2), p. A191 - A201

Photonic nanostructures for advanced light trapping in silicon solar cells: the impact of etching on the material electronic quality
Trompoukis, C.; Stesmans, A.; Simoen, E.; Depauw, V.; El Daif, O.; Lee, K.; Gordon, I.; Mertens, R. and Poortmans, J.
Physica Status Solidi. Rapid Research Letters 10 (2), p. 158 - 163

Progress on large area n-type silicon solar cells with front laser doping and a rear emitter
Uruena De Castro, A.; Aleman, M.; Cornagliotti, E.; Sharma, A.; Haslinger, M.; Tous, L.; Russell, R.; John, J.; Duerinckx, F. and Szlufcik, J.
Progress in Photovoltaics Research and Applications 24 (8), p. 1149 - 1156

Rear surface optimization of CZTS solar cells by use of a passivation layer with nanosized point openings
Vermang, B.; Ren, Y.; Donzel-Gargand, O.; Frisk, C.; Joel, J.; Salome, P.; Borme, J.; Sadewasser, S.; Platzer-Bjorkman, C. and Edoff, M.
IEEE Journal of Photovoltaics 6 (1)  p. 332 - 336

Impact of structure and homo-coupling of the central donor unit of small molecule organic semiconductors on solar cell performance
Verstappen, P.; Cardinaletti, I.; Vangerven, T.; Vanormelingen, W.; Verstraeten, F.; Lutsen, L.; Vanderzande, D.; Manca, J. and Maes, W.
RSC Advances 6 (38), p. 32298 - 32307

Positive bias temperature instability evaluation in fully recessed gate GaN MIS-FETs
Wu, T.; Franco, J.; Marcon, D.; De Jaeger, B.; Bakeroot, B.; Kang, X.; Stoffels, S.; Van Hove, M.; Groeseneken, G. and Decoutere, S.
IEEE International Reliability Physics Symposium - IRPS, p. 4A.2

Toward understanding positive bias temperature instability in fully recessed-gate GaN MISFETs
Wu, T.; Franco, J.; Marcon, D.; De Jaeger, B.; Bakeroot, B.; Stoffels, S.; Van Hove, M.; Groeseneken, G. and Decoutere,S.
IEEE Transactions on Electron Devices 63 (5), p. 1853 - 1860

Process development of silicon heterojunction interdigitated back-contacted (SHJ-IBC) solar cells bonded to glass
Xu, M.; Bearda, T.; Sivaramakrishnan Radhakrishnan, H.; Jonnak, S.; Filipic, M.; Depauw, V.; Van Nieuwenhuysen, K.; Abdulraheem, Y.; Debucquoy, M.; Gordon, I.; Szlufcik, J. and Poortmans, J.
32nd European Photovoltaic Solar Energy Conference and Exhibition - EPVSEC, p. 2BO.3.3

MOCVD growth of DH-HEMT buffers with low-temperature AlN interlayer on 200 mm Si (111) substrate for breakdown voltage enhancement
Zhao, M.; Liang, H.; Kandaswamy, P.; Van Hove, M.; Venegas, R.; Vrancken, E.; Favia, P.; Vanderheyden, A.; Vanhaeren, D.; Saripalli, Y.; Decoutere, S. and Langer, R.
Physica Status Solidi C 13 (42526), p. 311 - 316

Sensor systems for industrial applications

Planar waveguide Bragg grating sensors for composite monitoring
Teigell Beneitez, N.; Missinne, J.; Chiesura, G.; Luyckx, G.; Degrieck, J. and Van Steenberge, G.
Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems, p. 98033P

Other

Assessing the toxicity of Pb-and SQn-based perovskite solar cells in model organism
Danio rerio Babayigit, A.; Thanh, D.; Ethirajan, A.; Manca, J.; Muller, M.; Boyen, H. and Conings, B.
Scientific Reports 6, p. 18721

Electrochemical lithiation cycles of gold anodes observed by in situ high-energy X-ray diffraction
Bach, P.; Valencia-Jaime, I.; Rütt, U.; Gutowski, O.; Romero, A. and Renner, F.
Chemistry of Materials 28, p. 2941 - 2948

Anionic flow polymerizations towards functional polyphosphoesters in microreactors: polymerization and UV-modification
Baeten, E.; Vanslambrouck, S.; Jerome, C.; Lecomte, P. and Junkers, T.
European Polymer Journal 80, p. 208 - 218

Thick homoepitaxial (110)-oriented phosphorus-doped n-type diamond
Balasubramaniam, Y.; Pobedinskas, P.; Janssens, S.; Sakr, G.; Jomard, F.; Turner, S.; Lu, Y.; Dexters, W.; Soltani, A.; Verbeeck, J.; Barjon, J.; Nesladek, M. and Haenen, K.
Applied Physics Letters 109 (6), p. 62105

On-Chip transmitter and receiver front-ends for ultra-broadband wired and optical-fiber communications
Bauwelinck, J.; Soenen, W.; Moeneclaey, B.; Pierco, R.; Vaernewyck, R.; De Keulenaer, T.; Roelkens, G.; Torfs, G.; Yin, X. and Demeester, P.
Optical Fiber Communication Conference - OFC, p. Tu3B

Engineering of Functional Interfaces 2016 (Preface) Behrens, P.; Van Bael, M. and Hardy, A. 
Physica Status Solidi A 213 (6), p. 1371 - 1375

Nanofocusing of light into semiconducting fin photonic crystals
Bogdanowicz, J.; Nuytten, T.; Gawlik, A.; Schulze, A.; De Wolf, I. and Vandervorst, W.
Applied Physics Letters 108 (8), p. 83106

Regioregular polythiophene-porphyrin supramolecular copolymers for optoelectronic applications
Chevrier, M.; Kesters, J.; Blayo, C.; Richeter, S.; Van Der Lee, A.; Coulemnbier, O.; Surin, M.; Mehdi, A.; Lazzaroni, R.; Evans, R.; Maes, W.; Dubois, P. and Clément, S.
Macromolecular Chemistry and Physics 217, p. 445 - 458

UV-induced [2+2] grafting to reactions for polymer modifications of cellulose
Conradi, M.; Ramakers, G. and Junkers, T.
Macromolecular Rapid Communications 37 (2), p. 174

Gaining new insight into low-temperature aqueous photochemical solution deposited ferroelectricPbTiO3 films
De Dobbelaere, C.; Calzada, M.; Bretos, I.; Jimenez, R.; Ricote, J.; Hadermann, J.; Hardy, A. and Van Bael, M.
Materials Chemistry and Physics 174, p. 28 - 40

The decomposition of U(n) into XU(n) and ZU(n) De Vos, A. and De Baerdemacker, S.
Journal of Multiple-Valued Logic and Soft Computing 26 (42401), p. 141 - 156

Performance analysis of a parallel, multi-node pipeline for DNA sequencing
Decap, D.; Reumers, J.; Herzeel, C.; Costanza, P. and Fostier, J.
Parallel Processing and Applied Mathematics 11th International Conference - PPAM 2015, p. 233 - 243

CVD diamond growth from nanodiamond seeds buried under a thin chromium layer
Degutis, G.; Pobedinskas, P.; Turner, S.; Lu, Y.; Al Riyami, S.; Ruttens, B.; Yoshitake, T.; D'Haen, J.; Haenen, K.; Verbeeck, J.; Hardy, A. and Van Bael, M.
Diamond and Related Materials 64, p. 163 - 168

Self focusing SIMS : probing thin film composition in very confined volumes
Franquet, A.; Douhard, B.; Melkonyan, D.; Favia, P.; Conard, T. and Vandervorst, W.
Applied Surface Science 365, p. 143 - 152

The impact of hot-melt extrusion on the tableting behavior of polyvinyl alcohol
Grymonpré, W.; De Jaeghere, W.; Peeters, E.; Adriaensens, P.; Remon, J. and Vervaet, C.
International Journal of Pharmaceutics 498 (42401), p. 254 - 262

Diamond scanning probes with sub-nanometer resolution for advanced nanoelectronics device characterization
Hantschel, T.; Tsigkourakos, M.; Zha, L.; Nuytten, T.; Paredis, K. and Vandervorst, W.
Microelectronic Engineering 159, p. 46 - 50

Benchtop fluorination of fluorescent nanodiamonds on a preparative scale: toward unusually hydrophilic bright particles
Havlik, J.; Raabova, H.; Gulka, M.; Petrakova, V.; Krecmarova, M.; Masek, V.; Lousa, P.; Stursa, J.; Boyen, H.; Nesladek, M. and Cigler, P.
Advanced Functional Materials 26 (23), p. 4134 - 4142

The influence of conjugated polymer side chain manipulation on the efficiency and stability of polymer solar cells
Heckler, I.; Kesters, J.; Defour, M.; Madsen, M.; Penxten, H.; D'Haen, J.; Van Mele, B.; Maes, W. and Bundgaard, E.
Materials 9 (3), p. 181

Continuous photoflow synthesis of precision polymers
Junkers, T. and Wenn, B.
Reaction Chemistry & Engineering 1, p. 60 - 64

Improved molecular imprinting based on colloidal particles made from miniemulsion: a case study on testosterone and its structural analogues
Kellens, E.; Bové, H.; Conradi, M.; D'Olieslaeger, L.; Wagner, P.; Landfester, K.; Junkers, T. and Ethirajan, A.
Macromolecules 49, p. 2559 - 2567

Phosphorescence of free base corroles
Knyukshto, V.; Ngo, T.; Maes, W.; Kruk, M. and Dehaen, W.
RSC Advances 6 (50), p. 43911 - 43915

Determining free-radical propagation rate coefficients with high fequency lasers current status and future perspectives
Kockler, K.; Haehnel, A.; Junkers, T. and Barner-Kowollik, C.
Macromolecular Rapid Communications 37 (2), p. 123

A direct arylation approach towards efficeint small molecule organic solar cells
Kudrjasova, J.; Kesters, J.; Verstappen, P.; Brebels, J.; Vangerven, T.; Cardinaletti, I.; Drijkoningen, J.; Penxten, H.; Manca, J.; Lutsen, L.; Vanderzande, D. and Maes, W.
Journal of Materials Chemistry A 4, p. 791

Matlab to C compilation targeting application specific instruction set processors
Latifis, I.; Parashar, K.; Dimitroulakos, G.; Cappelle, H.; Lezos, C.; Masselos, K. and Catthoor, F.
Design, Automation and Test in Europe Conference - DATE , p. IP5

Mass calibration of the energy axis in ToF-E elastic recoil detection analysis
Meersschaut, J.; Laricchiuta, G. and Vandervorst, W.
Nuclear Instruments and Methods in Physics Research B, p. doi:10.1016/j.ni

Heat-transfer based chracterization of DNA on synthetic sapphire chips
Murib, M.; Yeap, W.; Eurlings, Y.; Van Grinsven, B.; Boyen, H.; Conings, B.; Michiels, L.; Ameloot, M.; Carleer, R.; Warmer, J.; Kaul, J.; Haenen, K.; Schöning, M.; De Ceuninck, W. and Wagner,P.
Sensors and Actuators B: Chemical 230, p. 260

Stress measurements in semiconductor devices using nano-focused Raman spectroscopy
Nuytten, T.; Kosemura, D.; Bogdanowicz, J.; Witters, L.; Eneman, G.; Hantschel, T.; Schulze, A.; Favia, P.; Bender, H.; De Wolf, I. and Vandervorst, W.
14th International Conference on Reliability and Stress-Related Phenomena in Nanoelectronics – Experiment and Simulation - IRSP

Dependence of electric potential at trench surfaces on ion angula distribution in plasma etching processes
Palov, A.; Mankelevich, Y.; Rakhimova, T. and Baklanov, M.
Journal of Physics D: Applied Physics 49 (10), p. 105203

Ionic strength dependent vesicle adsorption and phase behavior of anionic phospholipids on a gold substrate
Pramanik, S.; Seneca, S.; Ethirajan, A.; Neupane, S.; Renner, F. and Losada-Perez, P.
Biointerphases 11 (1), p. 019006-1

Enhanced optoelectronic performances of vertically aligned hexagonal boron nitride nanowalls-nanocrystalline diamond heterostructures
Sankaran, K.; Hoang, D.; Kunuku, S.; Korneychuk, S.; Turner, S.; Pobedinskas, P.; Drijkoningen, S.; Van Bael, M.; D'Haen, J.; Verbeeck, J.; Leou, K.; Lin, I. and Haenen, K.
Scientific Reports 6, p. 29444

Nitrogen incorporated ultrananocrystalline diamond microstructures from bias-enhanced microwave N2/CH4-plasma chemical vapor deposition
Sankaran, K.; Huang, B.; Saravanan, A.; Manoharan, D.; Tai, N. and Lin, I.
Plasma Processes and Polymers 13 (4), p. 419 - 428

Photoluminescence of Pr3+-doped calcium and strontium stannates
Stanulis, A.; Katelnikovas, A.; Van Bael, M.; Hardy, A.; Kareiva, A. and Justel, T.
Journal of Luminescence 172, p. 323

Homodiselenacalix[4]arenes: Molecules with unique chanelled crystal stuctures
Thomas, J.; Dobrzanska, L.; Van Meervelt, L.; Quevedo, M.; Wozniak, K.; Stachowicz, M.; Smet, M.; Maes, W. and Dehaen, W.
Chemistry. A European Journal 22, p. 979

Enhanced biosensor platforms for detecting atherosclerose biomarker VCAM1 based on bioconjugation with uniformly oriented VCAM1-targeting nanobodies
Tien Ta, D.; Guedens, W.; Vranken, T.; Vanschoenbeek, K.; Steen Redeker, E.; Michiels, L. and Adriaensens, P.
Biosensors 6, p. 34

Polyacrylates
Vandenbergh, J. and Junkers, T.
Handbook of thermoplastics, 2nd edition, p. 169 - 192

Acid-induced room temperature RAFT polymerization: synthesis and mechanistic insights
Vandenbergh, J.; Schweitzer-Chaput, B.; Klussmann, M. and Junkers, T.
Macromolecules 49 (11), p. 4124 - 4135

Four-point bending cycling as alternative for thermal cycling solder fatigue testing
Vandevelde, B.; Vanhee, F.; Pissoort, D.; Degrendele, L.; De Baets, J.; Allaert, B.; Lauwaert, R.; Labie, R. and Willems,G.
17th Int. Conf. on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectr. and Microsyst. - EuroSimE

A study on the thermal sintering process of silver nanoparticle inktjet inks to achieve smooth and highly conducting silver layers
Vandevenne, G.; Marchal, W.; Verboven, I.; Drijkoningen, J.; D'Haen, J.; Van Bael, M.; Hardy, A. and Deferme, W.
Physica Status Solidi A 213 (6), p. 1403 - 1409

Poly(3-hydroxybutyrate-co-3-hydroxyhexanoate) / organomodified montmorillonite nanocomposites for potential food packaging applications
Vandewijngaarden, J.; Wauters, R.; Murariu, M.; Dubois, P.; Carleer, R.; Yperman, J.; D'Haen, J.; Ruttens, B.; Schreurs, S.; Lepot, N.; Peeters, R. and Buntinx, M.
Journal of Polymers and the Environment 24 (2), p. 104 - 118

Kilohertz pulsed-laser-polymerization: Simultaneous determination of backbiting, secondary and tertiary radical propagation rate coefficients for tert-butyl acrylate
Wenn, B. and Junkers, T.
Macromolecular Rapid Communications 37 (9), p. 781 - 787

Efficient multiblock starpolymer synthesis from photo-induced copper-mediated polymerization with up to 21 arms
Wenn, B.; Martens, A.; Chuang, Y.; Gruber, J. and Junkers, T.
Polymer Chemistry 7 (15), p. 2720 - 2727

Controlled living polymerization towards functional poly(p-phenylene vinylene) materials
Zaquen, N.; Lutsen, L.; Vanderzande, D. and Junkers, T.
Polymer Chemistry 7, p. 1355 - 1367

n-Type phosphorus-doped nanocrystalline diamond: electrochemical and in situ Raman spectroelectrochemical study
Zivcova, Z.; Frank, O.; Drijkoningen, S.; Haenen, K.; Mortet, V. and Kavan, L.
RSC Advances 6 (56), p. 51387 - 51393

Deze website maakt gebruik van cookies met als enige doel het analyseren van surfgedrag, zonder enige commerciële insteek. Lees er hier meer over.

Accepteer cookies