On-chip integrated photonics for optical material characterization

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Design and characterization of process monitoring devices for photonic integrated circuits.

The research field of integrated photonics has found its way to a wide range of applications, which go from optical interconnects ICs to reduce the power consumption to bio-applications to drastically reduce the size of bench-top optical systems, e.g., miniaturized spectrometers for medical diagnostics.

Inline quantification of the optical properties used in integrated photonic devices is critical if one is to design and fabricate components and systems that perform as expected. Such optical material properties can be characterized with techniques like ellipsometry, however, these techniques are not suitable for inline characterization. We therefore need devices that can be placed side by side with actual functional devices. These device will most likely involve in the design of on-chip Mach-Zehnder interferometers.​

In this master thesis you will work towards the next generation of process monitoring experiments. First you will measure and analyze the current process monitoring experiments. With this learning and a literature study of the available alternatives, you will get the opportunity to design the next generation of process monitoring experiments.​​​

Tasks will include

  • Literature study
  • Characterization of existing photonic test structures
  • Data analysis and interpretation
  • Design and implementation of improved devices.​






Type of project: Thesis, Internship

Required degree: Master of Engineering Science, Master of Engineering Technology

Required background: Nanoscience & Nanotechnology, Physics, Electrotechnics/Electrical Engineering

Supervising scientist(s): For further information or for application, please contact: Bruno Figeys (Bruno.Figeys@imec.be)

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