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/ICMTS 2026

ICMTS 2026

March 23 - 26, 2026 | Matsue, Japan

IEEE International Conference on Microelectronic Test Structures

Imec contributions

Machine Learning-Based Failure Mode Detection in 3D-DRAM Gate-All-Around Select Transistors
Jerome Mitard1, Husnu Murat Kocak1, Romain Ritzenthaler1, Nouredine Rassoul1, Eren Canga1, A. Belmonte1
1imec (Belgium)

Active Learning on Capacitance-Voltage to Reduce Measurement Time
Husnu Murat Kocak2, Hiroaki Arimura1, Jerome Mitard1, Jesse Davis2
1imec (Belgium), 2KU Leuven (Belgium)

Event details

The IEEE International Conference on Microelectronic Test Structures (ICMTS) is the premier conference devoted to the development, measurement and analysis of test structures providing a forum for designers and users of test structures to discuss recent developments and future directions.

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