01 - 04 November 2023 | Gammarth, Tunisia
IEEE DTTIS conference (International Conference on Design, Test and Technology of Integrated Systems) is the result of merging two established IEEE conferences: IEEE DTIS (International Conference on Design and Technology of Integrated Systems in nanoscale era), and IEEE DTS (International Conference on Design and Test of Integrated Systems).
Keynote by Carolina Mora Lopez on Circuits and technologies for implantable biomedical devices
The aim of the conference is to cope with the rapidly progressing technology which, today, reaches the nanometer scale. The areas of interest include design, test and technology of electronic products, ranging from integrated circuit modules, chiplets and printed circuit boards to full systems and microsystems, as well as the methodologies and tools used in the design, verification and validation of such products. IEEE DTTIS will show innovations in system and platform design, which extend beyond a single integrated circuit. These platforms may include 2.5D/3D chiplet based system-in-package, system-on-interposer, and multi-die integrations. It will be an opportunity for researchers to present and discuss their latest work. IEEE DTTIS is, by design, a forum for engineers, researchers, graduate students and professors, to cross the design-technology boundary by bringing design, test, technology, and process experts together.
IEEE DTTIS will be organized annually in a Mediterranean country. The first edition is scheduled to be held in Tunis, Tunisia in the region of Gammarth. All accepted and presented papers will be published on the IEEE DTTIS Conference Proceedings and submitted for publication in IEEE Xplore. Best papers will be submitted for possible publication in a special issue of well-known journal.