International Test Conference (ITC 2025)
September 21 - 26, 2025 | San Diego, CA, USA
International Test Conference, the cornerstone of TestWeek™ events, is the world’s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.
Imec
- Chiplets' Die-to-Die Interconnect Repair Language (IRL) by Po-Yao Chuang, Researcher, imec
Thursday, September 25 - Session 21A - 13:30-15:00 - Chiplet Interconnect Test and Repair by Po-Yao Chuang, Researcher, imec
Wednesday, September 24 - Session 16D - 15:30-17:00 - Multi-die package and chiplet test applications by Po-Yao Chuang, Researcher, imec
Wednesday, September 24 - Session 13C - 10:30-12:00
About
International Test Conference, the cornerstone of TestWeek™ events, is the world’s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.