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RADECS 2025
September 29 - October 03, 2025 | Antwerp, Belgium
RADiation and its Effects on Components and Systems Conference
Imec
Our team will be present in the exhibit hall, booth 33. Visit us if you want to know more about imec's space offering and the DARE (Design Against Radiation Effects) technology platforms.
Below is the full list of imec contributions:
Papers (main author):
- PA-5: A Charge-Width Calibration Approach for the Compact Modeling of Single Event Transients, Z. Li(1), M. Gorbunov(1), H. Caldas kessler(1), G. Franciscatto(1), V. Kampati(2), J. Zhao(2), J. Prinzie(2), L. Berti(1), 1. IMEC, Belgium, 2. KU Leuven, Belgium
- PD-12L: Total Ionizing Dose Sensitivity of 7-nm FinFETs, Authors: M. Gorbunov(1), A. Caglar(1), M. Van de burgwal(1), L. Berti(1), G. Thys(1), T. Schulte(2), J. Vanden berk(2), D. Geys(2), 1. Imec, Belgium, 2. Magics Technologies NV, Belgium
- A1 - Experimental Calibration and Validation of a Voltage-Dependent SET Model in 65 nm CMOS - V. Kampati KU Leuven, Belgium, M. Gorbunov imec, Belgium, Z. Li imec, Belgium, B. Vignon imec, Belgium,, L. Berti imec, Belgium, P. Leroux KU Leuven, Belgium, J. Prinzie KU Leuven, Belgium
- DW-10: Radiation Characterization of a LEON5FT-based SoC on the DARE65T Platform, Authors: L. Tambara(1), M. Gorbunov(2), M. Van de burgwal(2), L. Berti(2), J. Hellström(1), A. Oliveira(1), J. Andersson nerén(1), 1. Frontgrade Gaisler AB, Sweden, 2. Imec, Belgium
- D5: Evaluation of Total Ionizing Dose Radiation Effects on Device and Circuit Variability in 22 nm FD-SOI, Authors: J. Zhao(1), Q. Yihong(2), L. Zheyi(3), M. Gorbunov(3), Q. Ma(2), X. Pengfei(2), L. Marien(2), T. Maraine(4), F. Saigné(5), P. Leroux(2), J. Prinzie(2), 1. KU Leuven, China, 2. KU Leuven, Belgium, 3. Imec, Belgium, 4. Universit´e de Montpellier, France, 5. Université de Montpellier, France
Papers (co-author):
- A1 - Experimental Calibration and Validation of a Voltage-Dependent SET Model in 65 nm CMOS - V. Kampati KU Leuven, Belgium, M. Gorbunov imec, Belgium, Z. Li imec, Belgium, B. Vignon imec, Belgium,, L. Berti imec, Belgium, P. Leroux KU Leuven, Belgium, J. Prinzie KU Leuven, Belgium
- DW-10: Radiation Characterization of a LEON5FT-based SoC on the DARE65T Platform, Authors: L. Tambara(1), M. Gorbunov(2), M. Van de burgwal(2), L. Berti(2), J. Hellström(1), A. Oliveira(1), J. Andersson nerén(1), 1. Frontgrade Gaisler AB, Sweden, 2. Imec, Belgium
- D5: Evaluation of Total Ionizing Dose Radiation Effects on Device and Circuit Variability in 22 nm FD-SOI, Authors: J. Zhao(1), Q. Yihong(2), L. Zheyi(3), M. Gorbunov(3), Q. Ma(2), X. Pengfei(2), L. Marien(2), T. Maraine(4), F. Saigné(5), P. Leroux(2), J. Prinzie(2), 1. KU Leuven, China, 2. KU Leuven, Belgium, 3. Imec, Belgium, 4. Universit´e de Montpellier, France, 5. Université de Montpellier, France
Short course:
- Design Tools For Assisting Analog/Mixed-signal Circuit Against Radiation Effects - Zheyi Li (imec, BE), https://www.radecs2025.org/short-course
Session chair:
- F: Radiation hardening techniques - Laurent Berti
Event
The RADiation Effects on Components and Systems (RADECS) Conference is an annual European (and, more generally, international) scientific and industrial forum on radiation and its effect on electronics and photonics materials, devices and systems. Every year it attracts hundreds of scientists and engineers from all over the world, focusing on the latest advances and results about open topics and challenges related to radiation effects.