Impact of unit processes on the optical properties of electro optic materials

Integrating these materials at a wafer scale is essential for scaling up the technology. In order to do the same, one needs to clearly understand the impact of different process steps (cleaning, etching, annealing) on the material property. As part of this internship/thesis, the focus will be on metrology and characterization of electro-optic materials. The characterization will involve optical loss measurement before and after processing of the electro optic material. Additional physical characterizations may also be part of this study, depending on the initial outcome of the investigation.