Data-driven quantification of crystal quality in advanced semiconductor devices by electron microscopy
Master projects/internships - Leuven | Just now
Are you fascinated by the atomic-scale world and eager to push the boundaries of materials characterization? Join imec’s Materials and Component Analysis (MCA) team and discover how advanced transmission electron microscopy (TEM) can reveal the secrets of novel materials and architectures for future semiconductor devices.
What will you do?
During this internship, you’ll focus on building a data analysis toolbox that combines traditional image processing techniques with cutting-edge machine learning approaches. Your goal? To assess the crystal quality of semiconductor devices.
TEM imaging is essential for developing these materials, but interpreting the images is the real challenge. How can we automatically detect and quantify grain boundaries, interfaces, and defects? How do we measure interface roughness at the atomic level?
To tackle these questions, you’ll explore data-driven methods that are transforming the way we analyse materials.
Your research will concentrate on:
- Exploring quantitative image processing techniques for defects in 2D materials and multi-stack interfaces.
- Validating and improving existing algorithms for TEM image analysis.
- Testing new approaches, including unsupervised algorithms.
- Explore the use of automation.
- Extend the toolbox to characterize sample/stack/structure for different materials.
- Sharing your findings through reports and publication in leading scientific journals and conferences.
Master's degree: Master of Science
Required educational background: Computer Science
Duration: 1 year
For more information or application, please contact the supervising scientists Andrey Orekhov (andrey.orekhov@imec.be), Eva Grieten (eva.grieten@imec.be) and Paola Favia (paola.favia@imec.be).
Imec allowance will be provided for students studying at a non-Belgian university.